Effort-Aware semi-Supervised just-in-Time defect prediction

2020 ◽  
Vol 126 ◽  
pp. 106364
Author(s):  
Weiwei Li ◽  
Wenzhou Zhang ◽  
Xiuyi Jia ◽  
Zhiqiu Huang
2019 ◽  
Vol 150 ◽  
pp. 22-36 ◽  
Author(s):  
Luca Pascarella ◽  
Fabio Palomba ◽  
Alberto Bacchelli

Author(s):  
Liqiong Chen ◽  
Shilong Song ◽  
Can Wang

Just-in-time software defect prediction (JIT-SDP) is a fine-grained software defect prediction technology, which aims to identify the defective code changes in software systems. Effort-aware software defect prediction is a software defect prediction technology that takes into consideration the cost of code inspection, which can find more defective code changes in limited test resources. The traditional effort-aware defect prediction model mainly measures the effort based on the number of lines of code (LOC) and rarely considers additional factors. This paper proposes a novel effort measure method called Multi-Metric Joint Calculation (MMJC). When measuring the effort, MMJC takes into account not only LOC, but also the distribution of modified code across different files (Entropy), the number of developers that changed the files (NDEV) and the developer experience (EXP). In the simulation experiment, MMJC is combined with Linear Regression, Decision Tree, Random Forest, LightGBM, Support Vector Machine and Neural Network, respectively, to build the software defect prediction model. Several comparative experiments are conducted between the models based on MMJC and baseline models. The results show that indicators ACC and [Formula: see text] of the models based on MMJC are improved by 35.3% and 15.9% on average in the three verification scenarios, respectively, compared with the baseline models.


2019 ◽  
Vol 25 (1) ◽  
pp. 890-939 ◽  
Author(s):  
Masanari Kondo ◽  
Daniel M. German ◽  
Osamu Mizuno ◽  
Eun-Hye Choi

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