Influence of temperature on the dielectric and ferroelectric properties of bismuth titanate thin films obtained by the polymeric precursor method

2005 ◽  
Vol 92 (2-3) ◽  
pp. 373-378 ◽  
Author(s):  
A.Z. Simões ◽  
M.A. Ramirez ◽  
C.S. Riccardi ◽  
A. Ries ◽  
E. Longo ◽  
...  
Keyword(s):  
Thin Films ◽  
Bismuth Titanate ◽  
Ferroelectric Properties ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Influence Of Temperature ◽  
Influence Of Temperature On

Microstructural and ferroelectric properties of PbZr1−xTixO3 thin films prepared by the polymeric precursor method

2001 ◽  
Vol 49 (6) ◽  
pp. 365-370 ◽  
Author(s):  
M.S.J Nunes ◽  
E.R Leite ◽  
F.M Pontes ◽  
N.M Duboc ◽  
E Longo ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Properties ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method

Ferroelectric and Dielectric Characteristics of Bi3.25La0.75Ti3O12 Thin Films Prepared by the Polymeric Precursor Method

2006 ◽  
Vol 514-516 ◽  
pp. 212-215 ◽  
Author(s):  
A.Z. Simões ◽  
M.A. Ramírez ◽  
B.D. Stojanović ◽  
Z. Marinković ◽  
Elson Longo ◽  
...  
Keyword(s):  
Thin Films ◽  
Leakage Current ◽  
Ferroelectric Properties ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Force Microscopy ◽  
Dense Microstructure ◽  
Atomic Force ◽  
Current Characteristics

The ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 (LSCO) by the polymeric precursor method were investigated. Atomic force microscopy indicates that the deposited films exhibit a dense microstructure with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the plate-like grains of the BLT films.

Ferroelectric and Dielectric Properties of Lanthanum-Modified Bismuth Titanate Thin Films Obtained by the Polymeric Precursor Method

2004 ◽  
Vol 13 (1-3) ◽  
pp. 65-70 ◽  
Author(s):  
A. Z. Sim�es ◽  
A. H. M. Gonzalez ◽  
C. S. Riccardi ◽  
E. C. Souza ◽  
F. Moura ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Bismuth Titanate ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method

Characterization of lanthanum-doped bismuth titanate thin films prepared by polymeric precursor method

2004 ◽  
Vol 58 (22-23) ◽  
pp. 2842-2847 ◽  
Author(s):  
A.Z Simões ◽  
C.S Riccardi ◽  
F Moura ◽  
A Ries ◽  
N.L.A Junior ◽  
...  
Keyword(s):  
Thin Films ◽  
Bismuth Titanate ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method

Electrical Characterization of Lanthanum-Modified Bismuth Titanate Thin Films Obtained by the Polymeric Precursor Method

2004 ◽  
Vol 60 (1) ◽  
pp. 21-31 ◽  
Author(s):  
A. Z. SIM[Otilde]ES ◽  
B. D. STOJANOVIC ◽  
M. A. ZAGHETE ◽  
C. S. RICCARDI ◽  
A. RIES ◽  
...  
Keyword(s):  
Thin Films ◽  
Bismuth Titanate ◽  
Electrical Characterization ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method

Effect of Thermal Treatment on the Morphology of PLZT Thin Films Prepared from Polymeric Precursor Method

2001 ◽  
Vol 189-191 ◽  
pp. 155-160 ◽  
Author(s):  
A.H.M. González ◽  
A.Z. Simões ◽  
José Arana Varela ◽  
M.A. Zaghete ◽  
Elson Longo
Keyword(s):  
Thin Films ◽  
Thermal Treatment ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Plzt Thin Films
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