Compositional dependence of refractive index and oscillator parameters in TlGaS2xSe2(1−x) layered mixed crystals (0 ≤ x ≤ 1)

2012 ◽  
Vol 136 (1) ◽  
pp. 259-263 ◽  
Author(s):  
N.M. Gasanly
2015 ◽  
Vol 68 ◽  
pp. 27-34 ◽  
Author(s):  
Saisudha B. Mallur ◽  
Tyler Czarnecki ◽  
Ashish Adhikari ◽  
Panakkattu K. Babu

2009 ◽  
Vol 182 (10) ◽  
pp. 2756-2761 ◽  
Author(s):  
L. Petit ◽  
N. Carlie ◽  
H. Chen ◽  
S. Gaylord ◽  
J. Massera ◽  
...  

2020 ◽  
Vol 65 (5) ◽  
pp. 453
Author(s):  
V. S. Bilanych ◽  
K. V. Skubenych ◽  
M. I. Babilya ◽  
A. I. Pogodin ◽  
I. P. Studenyak

(CuxAg1−x)7SiS5I mixed crystals were grown by the Bridgman–Stockbarger method. The microhardness measurements are carried out at room temperature using a Vickers indenter. The compositional dependence of the microhardness is studied. The dependence of the microhardness on the depth of imprint is analyzed in the model of geometrically necessary dislocations. The indentation size effect is observed. It is established that the microhardness of (CuxAg1−x)7SiS5I mixed crystals decreases at the substitution of Cu atoms by Ag atoms.


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