As demonstrated early 1980’s (1), the scanning electron rnicrocopy-electron channelling pattern (SEM-ECP) technique is very powerful in determination of orientation of individual grains and the character of grain boundaries in polycrystalline materials. Figure 1(a) and (b) show SEM and ECP images of a grain boundary in polycrystal line iron-6.5 mass % silicon ribbon produced by rapid solidification and subsequent annealing. We can intuitively recognize from the SEM-ECP image that the character of the boundary is of <100> tilt type with about 7° misorientation angle. This kind of direct observation is very useful for a study of grain boundary migration and grain growth.This paper discusses advantages of the SEM-ECP technique for the precise determination of the character of grain boundary and for statistical analysis of grain boundaries to bridge roles of individual grain boundaries and bulk properties in a polycrystal. The new microstructural parameter associated with grin boundary termed “grain boundary character distribution (GBCD)” which was introduced by the present author (2,3) and has been utilized in designing and engineering grain boundaries in order to produce desirable and/or high bulk performance in polycrystalline materials (4,5). GBCD describes the type and the frequency of different types of grain boundaries, ie. random general boundaries and special boundaries like low-angle boundaries and low Σ coincidence boundaries.
