The investigation of the antireflection method and laser induced damage properties for perfluoroalkoxy copolymer film as short pulse laser debris shields

2021 ◽  
pp. 131601
Author(s):  
Minglong Zhong ◽  
Laixi Sun ◽  
Qinghua Deng ◽  
Zhiqing Wu ◽  
Chaoyang Wang ◽  
...  
2012 ◽  
Author(s):  
Katsuhiro Mikami ◽  
Shinji Motokoshi ◽  
Toshihiro Somekawa ◽  
Takahisa Jitsuno ◽  
Masayuki Fujita ◽  
...  

Author(s):  
F. Beaudoin ◽  
P. Perdu ◽  
C. DeNardi ◽  
R. Desplats ◽  
J. Lopez ◽  
...  

Abstract Ultra-short pulse laser ablation is applied to IC backside sample preparation. It is contact-less, non-thermal, precise and can ablate the various types of material present in IC packages. This study concerns the optimization of ultra-short pulse laser ablation for silicon thinning. Uncontrolled silicon roughness and poor uniformity of the laser thinned cavity needed to be tackled. Special care is taken to minimize the silicon RMS roughness to less than 1µm. Application to sample preparation of 256Mbit devices is presented.


2013 ◽  
Vol 115 (4) ◽  
pp. 1469-1477 ◽  
Author(s):  
Evgeny Kharanzhevskiy ◽  
Sergey Reshetnikov

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