Flying Probe measurement accuracy improvement by external LCR integration

Measurement ◽  
2022 ◽  
pp. 110703
Author(s):  
Raul Ionel ◽  
Liliana Mâţiu-Iovan
Keyword(s):  
Measurement Accuracy ◽  
Probe Measurement ◽  
Accuracy Improvement

scholarly journals Geometry Optimization of Sheet Specimen for the Measurement Accuracy Improvement in the Hopkinson Bar Based on Intelligent Algorithm

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 99655-99664
Author(s):  
Qinghua Wang ◽  
Feng Xu ◽  
Bo Yang ◽  
Lijie Feng ◽  
Dedong Huang ◽  
...  
Keyword(s):  
Measurement Accuracy ◽  
Geometry Optimization ◽  
Hopkinson Bar ◽  
Intelligent Algorithm ◽  
Accuracy Improvement

scholarly journals Design Optimization for the Measurement Accuracy Improvement of a Large Range Nanopositioning Stage

Sensors ◽  
2016 ◽  
Vol 16 (1) ◽  
pp. 84 ◽  
Author(s):  
Marta Torralba ◽  
José Yagüe-Fabra ◽  
José Albajez ◽  
Juan Aguilar
Keyword(s):  
Design Optimization ◽  
Measurement Accuracy ◽  
Large Range ◽  
Accuracy Improvement

Station-transfer measurement accuracy improvement of laser tracker based on photogrammetry

Measurement ◽  
2016 ◽  
Vol 94 ◽  
pp. 717-725 ◽  
Author(s):  
Gang Zhao ◽  
Chengyang Zhang ◽  
Xishuang Jing ◽  
Zhanlei Sun ◽  
Yuxiang Zhang ◽  
...  
Keyword(s):  
Measurement Accuracy ◽  
Laser Tracker ◽  
Accuracy Improvement ◽  
Transfer Measurement

scholarly journals Information and measurement system of weapon stabilization parameters based on precision piezoelectric sensitive element

2020 ◽  
Vol 166 ◽  
pp. 05005
Author(s):  
Andrii Tkachuk ◽  
Olena Bezvesilna ◽  
Oleksandr Dobrzhanskyi ◽  
Anna Ostapchuk ◽  
Mykola Horodyskyi
Keyword(s):  
Measurement System ◽  
System Performance ◽  
Sensitive Element ◽  
Measurement Accuracy ◽  
Classical System ◽  
Sensing Element ◽  
External Disturbances ◽  
Accuracy Improvement ◽  
Constructive Methods ◽  
Signal Amplifier

The structure and principle of information and measurement system performance of weapon stabilization are described. Established, that the classical stabilization system consists of a stabilizing platform of the sensitive element (or block of sensitive elements), defining the absolute angle of platform α rotation, the sensing element output signal amplifier, engines and tachometers. The classical system of indirect stabilization is reviewed, its mathematical description is made. A new precision sensitive element for the information and measurement system of weapon stabilization is suggested, the principle of its performance is introduced. Constructive methods of measurement accuracy improvement in the new sensitive element are analyzed. A simulation of the new sensitive element performance influenced by the external disturbances is carried out.

scholarly journals Measurement accuracy improvement with PZT scanning for detection of DPC in Hi-Bi fibers

2002 ◽  
Vol 10 (15) ◽  
pp. 685 ◽  
Author(s):  
Wencai Jing ◽  
Yimo Zhang ◽  
Ge Zhou ◽  
Feng Tang ◽  
Haifeng Li
Keyword(s):  
Measurement Accuracy ◽  
Accuracy Improvement

Study on the Stability of Micro-Area Sheet Resistance at Testing a Large Silicon Wafer when Probes Vacillated

2013 ◽  
Vol 303-306 ◽  
pp. 399-402 ◽  
Author(s):  
Xin Fu Liu ◽  
Zhi Hui Zhu ◽  
Ru Qing Zhang ◽  
Run Li Zhang
Keyword(s):  
Sheet Resistance ◽  
Silicon Wafer ◽  
Measurement Accuracy ◽  
Probe Measurement ◽  
Measurement Technology ◽  
Calculation Formula ◽  
Basic Principles ◽  
Basic Concepts ◽  
The Stability ◽  
The Impact

This article briefly elaborated the basic concepts of the probe vacillated at testing a large silicon wafer with square four point probe equipment. The importance of the micro-area’s sheet resistance is discussed and the basic principles of four point probe measurement technology are analyzed. Some factors that affect the measurement accuracy are studied, and interference can be avoided while measuring and analyzing the impact on square four point probe measurement by probe vacillate. The calculation formula of the square micro-area probe measurement is deduced when probes vacillated discretionarily. At last, an experiment was made with a small wafer sample and accurate resistivity was gotten.

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