Polarization phase in aberration compensation

Micron ◽  
2007 ◽  
Vol 38 (2) ◽  
pp. 158-164 ◽  
Author(s):  
D. Roychowdhury ◽  
K. Bhattacharya ◽  
A.K. Chakraborty
Keyword(s):  
2011 ◽  
Vol 51 (1) ◽  
pp. 126 ◽  
Author(s):  
S. Sarkar ◽  
N. Ghosh ◽  
S. Chakraborty ◽  
K. Bhattacharya

2016 ◽  
Vol 34 (2) ◽  
pp. 633-642 ◽  
Author(s):  
Hung Nguyen Tan ◽  
Takashi Inoue ◽  
Takayuki Kurosu ◽  
Shu Namiki

2010 ◽  
Vol 30 (1) ◽  
pp. 127-131
Author(s):  
孔梅梅 Kong Meimei ◽  
高志山 Gao Zhishan ◽  
陈磊 Chen Lei ◽  
徐春生 Xu Chunsheng

2009 ◽  
Vol 36 (6) ◽  
pp. 1437-1441
Author(s):  
卢常勇 Lu Changyong ◽  
刘旭 Liu Xu ◽  
刘洋 Liu Yang ◽  
李莉 Li Li ◽  
王小兵 Wang Xiaobing ◽  
...  

2016 ◽  
Vol 43 (2) ◽  
pp. 0202006
Author(s):  
董苏惠 Dong Suhui ◽  
王小林 Wang Xiaolin ◽  
粟荣涛 Su Rongtao ◽  
周朴 Zhou Pu ◽  
杨丽佳 Yang Lijia

2016 ◽  
Vol 679 ◽  
pp. 129-134
Author(s):  
Wan Duo Wu ◽  
Qiang Xian Huang ◽  
Chao Qun Wang ◽  
Ting Ting Wu ◽  
Hong Xie

The technique utilizing single-frequency laser interferometry has very high measurement accuracy, but it has rigorous requirements for optical design which is affected by many factors. In order to achieve single-frequency laser interferometry with large stroke and high precision, the integral layout, the polarization phase shifting technique and the common mode rejection method are adopted to design the length interferometry system. This paper analyzes factors and design requirements which affect measurement accuracy with large stroke. Based on polarization phase shifting technique, the system employs the four-beam-signal detection technique and the common mode rejection method, to make a differential processing of four mutually orthogonal signals. Thus, the influences of zero-drift of intensity and environmental change on system are reduced. Combined with a 200 phase subdivision, the system achieves the resolution with 0.8 nm. Under the VC++ environment, the displacement measurement results are compensated and corrected according to the environmental parameters. Compared with the Renishaw XL-80 laser interferometer, the system has better stability in short term. In the measuring range of 60 mm, the effectiveness of the system is verified.


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