LCC-Demons: A robust and accurate symmetric diffeomorphic registration algorithm

As promising technology with low requirements and high depositing efficiency, Wire Arc Additive Manufacturing (WAAM) can significantly reduce the repair cost and improve the formation quality of molds. To further improve the accuracy of WAAM in repairing molds, the point cloud model that expresses the spatial distribution and surface characteristics of the mold is proposed. Since the mold has a large size, it is necessary to be scanned multiple times, resulting in multiple point cloud models. The point cloud registration, such as the Iterative Closest Point (ICP) algorithm, then plays the role of merging multiple point cloud models to reconstruct a complete data model. However, using the ICP algorithm to merge large point clouds with a low-overlap area is inefficient, time-consuming, and unsatisfactory. Therefore, this paper provides the improved Offset Iterative Closest Point (OICP) algorithm, which is an online fast registration algorithm suitable for intelligent WAAM mold repair technology. The practicality and reliability of the algorithm are illustrated by the comparison results with the standard ICP algorithm and the three-coordinate measuring instrument in the Experimental Setup Section. The results are that the OICP algorithm is feasible for registrations with low overlap rates. For an overlap rate lower than 60% in our experiments, the traditional ICP algorithm failed, while the Root Mean Square (RMS) error reached 0.1 mm, and the rotation error was within 0.5 degrees, indicating the improvement of the proposed OICP algorithm.

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Accurate and Robust Alignment of Differently Stained Histologic Images Based on Greedy Diffeomorphic Registration

Applied Sciences ◽

10.3390/app11041892 ◽

2021 ◽

Vol 11 (4) ◽

pp. 1892

Author(s):

Ludovic Venet ◽

Sarthak Pati ◽

Michael D. Feldman ◽

MacLean P. Nasrallah ◽

Paul Yushkevich ◽

...

Keyword(s):

Immune Cell ◽

Tissue Sample ◽

Disease Process ◽

Spatial Arrangement ◽

General Purpose ◽

Growth Patterns ◽

Histological Image ◽

Target Registration Error ◽

Diffeomorphic Registration ◽

3D Information

Histopathologic assessment routinely provides rich microscopic information about tissue structure and disease process. However, the sections used are very thin, and essentially capture only 2D representations of a certain tissue sample. Accurate and robust alignment of sequentially cut 2D slices should contribute to more comprehensive assessment accounting for surrounding 3D information. Towards this end, we here propose a two-step diffeomorphic registration approach that aligns differently stained histology slides to each other, starting with an initial affine step followed by estimating a deformation field. It was quantitatively evaluated on ample (n = 481) and diverse data from the automatic non-rigid histological image registration challenge, where it was awarded the second rank. The obtained results demonstrate the ability of the proposed approach to robustly (average robustness = 0.9898) and accurately (average relative target registration error = 0.2%) align differently stained histology slices of various anatomical sites while maintaining reasonable computational efficiency (<1 min per registration). The method was developed by adapting a general-purpose registration algorithm designed for 3D radiographic scans and achieved consistently accurate results for aligning high-resolution 2D histologic images. Accurate alignment of histologic images can contribute to a better understanding of the spatial arrangement and growth patterns of cells, vessels, matrix, nerves, and immune cell interactions.

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