Characterization of Schottky-diode X/γ-ray detectors based on CdTe crystals with different uncompensated impurity concentrations
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2013 ◽
Vol 415
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pp. 77-81
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2018 ◽
Vol 88
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pp. 256-261
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2010 ◽
Vol 31
(4)
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pp. 910-914
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2016 ◽
Vol 54
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pp. 29-35
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