scholarly journals An analytical energy-loss line shape for high depth resolution in ion-beam analysis

2007 ◽  
Vol 256 (1) ◽  
pp. 92-96 ◽  
Author(s):  
P.L. Grande ◽  
A. Hentz ◽  
R.P. Pezzi ◽  
I.J.R. Baumvol ◽  
G. Schiwietz
Keyword(s):  
Energy Loss ◽  
Line Shape ◽  
Ion Beam ◽  
Depth Resolution ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
High Depth

scholarly journals Ion Beam Analysis for the Investigation of Diffusion Processes

2020 ◽  
Vol 13 ◽  
pp. 51
Author(s):  
H.-W. Becker
Keyword(s):  
Diffusion Processes ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Diffusion Studies ◽  
New Applications ◽  
Diffusion Of Hydrogen ◽  
High Depth

The unique advantages of ion beam analysis, such as the depth resolved unam- biguous stoichometric information of RBS or the possibility to detect hydrogen with high depth resolution still opens new applications in fundamental as well as applied science. Two examples are presented here.The diffusion of hydrogen in cement during the formation of cement has been studied with the 15N hydrogen depth profiling. It could be shown, that the known stages of the hydration process are correlated with the diffusion of hydrogen on a nanometer scale.Diffusion processes play also an important role in geology. The investigation of such processes with RBS will be presented. Prospects of diffusion studies using isotopie tracing with low lying resonances will be discussed.

scholarly journals Quantitative Ion Beam Analysis for Light Elements using In-air and High Depth Resolution Systems

2020 ◽  
Vol 45 (4) ◽  
pp. 97-101
Author(s):  
Kohtaku Suzuki ◽  
Ryoya Ishigami ◽  
Kazufumi Yasunaga ◽  
Keisuke Yasuda
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Light Elements ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
High Depth

COMPLEMENTARY TECHNIQUES TO HIGH ENERGY ION BEAM ANALYSIS

2001 ◽  
Vol 15 (28n29) ◽  
pp. 1402-1410
Author(s):  
J. B. METSON ◽  
M. J. GUSTAFSSON
Keyword(s):  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Polymeric Materials ◽  
Depth Resolution ◽  
High Energy ◽  
Ion Beams ◽  
Secondary Process ◽  
Ion Beam Analysis ◽  
Beam Analysis

Ion beam analysis methods generally rely on either the scattering of a high energy primary particle, or secondary process arising from the stopping of this particle in the substrate. The information typically obtained is the identification and quantitation of elements present, often resolved in terms of their depth distribution. However, there are a variety of techniques which offer complementary information on the structure composition and chemistry of a surface. These are typified by rather softer interactions with the surface, typified by low energy (kV) ion beams or photons, which interact with the surface in rather more complex manner than higher energy ion beams. The combination of energy and momentum transfer for the ion beams, makes these methods less quantitative, but opens up the potential for more chemically detailed information on the nature of the surface. Secondary ion mass spectrometry (SIMS), both static and dynamic, and X-ray Photoelectron Spectroscopy (XPS) will be discussed in some detail. SIMS offers excellent compositional depth profiling capability, but offers poor quantitation, while XPS offers unparalleled chemical detail, but limited lateral and depth resolution. The underlying processes which dictate the strengths and limitations of these techniques are discussed, along with a number of typical applications to the analysis of oxide films and polymeric materials.

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