Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy
2010 ◽
Vol 268
(19)
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pp. 3186-3190
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Keyword(s):
2004 ◽
Vol 445-446
◽
pp. 367-369
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2009 ◽
Vol 42
(11)
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pp. 115418
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Keyword(s):
2017 ◽
Vol 52
(12)
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pp. 7615-7623
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Keyword(s):
2012 ◽
Vol 331
◽
pp. 41-52
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