Direct evidence by positron annihilation spectroscopy of defect distributions deeper thanRpin Ar+implanted silica glass
2009 ◽
Vol 42
(11)
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pp. 115418
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Keyword(s):
2010 ◽
Vol 268
(19)
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pp. 3186-3190
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Keyword(s):
2017 ◽
Vol 52
(12)
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pp. 7615-7623
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Keyword(s):
2012 ◽
Vol 331
◽
pp. 41-52
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