Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra

2011 ◽  
Vol 269 (14) ◽  
pp. 1675-1678 ◽  
Author(s):  
Maurizio Dapor ◽  
Lucia Calliari ◽  
Giorgina Scarduelli
Keyword(s):  
Monte Carlo ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

scholarly journals Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models

Carbon ◽  
2017 ◽  
Vol 118 ◽  
pp. 299-309 ◽  
Author(s):  
Martina Azzolini ◽  
Tommaso Morresi ◽  
Giovanni Garberoglio ◽  
Lucia Calliari ◽  
Nicola M. Pugno ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Energy Loss ◽  
Monte Carlo Simulations ◽  
Electron Energy ◽  
Dielectric Response ◽  
Response Models ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Monte Carlo Simulations of Electron Energy-Loss Spectra with the Addition of Fine Structure from Density Functional Theory Calculations

2016 ◽  
Vol 22 (1) ◽  
pp. 219-229 ◽  
Author(s):  
Mohammad Attarian Shandiz ◽  
Maxime J.-F. Guinel ◽  
Majid Ahmadi ◽  
Raynald Gauvin
Keyword(s):  
Density Functional Theory ◽  
Monte Carlo ◽  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Density Functional ◽  
Density Functional Theory Calculations ◽  
Functional Theory ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

AbstractA new approach is presented to introduce the fine structure of core-loss excitations into the electron energy-loss spectra of ionization edges by Monte Carlo simulations based on an optical oscillator model. The optical oscillator strength is refined using the calculated electron energy-loss near-edge structure by density functional theory calculations. This approach can predict the effects of multiple scattering and thickness on the fine structure of ionization edges. In addition, effects of the fitting range for background removal and the integration range under the ionization edge on signal-to-noise ratio are investigated.

Parallel Detection of Electron Energy Loss Spectra in Direct Mode

1990 ◽  
Vol 48 (2) ◽  
pp. 82-83
Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Energy Resolution ◽  
Large Angle ◽  
Maximum Energy ◽  
Semiconductor Detectors ◽  
Parallel Detection ◽  
Photodiode Arrays ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.

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