Evaluation of lattice displacement in Mg – Implanted GaN by Rutherford backscattering spectroscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2017.03.125 ◽

2017 ◽

Vol 409 ◽

pp. 302-304 ◽

Author(s):

N. Nishikata ◽

K. Kushida ◽

T. Nishimura ◽

T. Mishima ◽

K. Kuriyama ◽

...

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Lattice Displacement

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Rutherford backscattering spectroscopy of amorphous films of Ag–As–S system prepared by spin-coating technique

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2004.01.180 ◽

2004 ◽

Vol 219-220 ◽

pp. 875-879 ◽

Author(s):

T. Wágner ◽

T. Kohoutek ◽

V. Perina ◽

A. Mackova ◽

V. Hnatowitz ◽

...

Keyword(s):

Spin Coating ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Spin Coating Technique ◽

Amorphous Films ◽

Coating Technique

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Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy

Nuclear Materials and Energy ◽

10.1016/j.nme.2018.10.004 ◽

2018 ◽

Vol 17 ◽

pp. 147-151 ◽

Author(s):

M. Mayer ◽

T.F. Silva ◽

R. Arredondo ◽

M. Balden ◽

I. Bogdanović-Radović ◽

...

Keyword(s):

High Resolution ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Model Systems ◽

Surface Enrichment ◽

Resolution Time ◽

Tungsten Surface

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Surface analysis of a GaAs electron source using Rutherford backscattering spectroscopy

Applied Physics Letters ◽

10.1063/1.112353 ◽

1994 ◽

Vol 65 (3) ◽

pp. 301-302 ◽

Author(s):

R. Calabrese ◽

V. Guidi ◽

P. Lenisa ◽

B. Maciga ◽

G. Ciullo ◽

...

Keyword(s):

Surface Analysis ◽

Electron Source ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy

Surface Science ◽

10.1016/j.susc.2012.07.013 ◽

2012 ◽

Vol 606 (21-22) ◽

pp. 1693-1699 ◽

Author(s):

Kaoru Nakajima ◽

Shinichi Oshima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures

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Sorption Mechanism of Europium by Apatite Using Rutherford Backscattering Spectroscopy and Resonant Nuclear React ion Analysis

Journal of Nuclear Science and Technology ◽

10.1080/18811248.1997.9732056 ◽

1997 ◽

Vol 34 (1) ◽

pp. 58-62 ◽

Author(s):

Toshihiko OHNUKI ◽

Naofumi KOZAI ◽

Hiroshi ISOBE ◽

Takashi MURAKAMI ◽

Shunya YAMAMOTO ◽

...

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Sorption Mechanism ◽

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Use of Rutherford backscattering spectroscopy to investigate anion exchange constants of protonated poly(4-vinylpyridine)

Chemistry of Materials ◽

10.1021/cm00020a013 ◽

1992 ◽

Vol 4 (2) ◽

pp. 284-290 ◽

Author(s):

Jian Huang ◽

Mark S. Wrighton

Keyword(s):

Anion Exchange ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Exchange Constants

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Rutherford Backscattering Spectroscopy

Encyclopedia of Materials: Science and Technology ◽

10.1016/b0-08-043152-6/01475-3 ◽

2001 ◽

pp. 8242-8247

Author(s):

H. Bakhru

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Auger electron spectroscopy and Rutherford backscattering spectroscopy studies of TiN and TiC coatings prepared by the activated reactive evaporation process

Thin Solid Films ◽

10.1016/0040-6090(87)90178-7 ◽

1987 ◽

Vol 153 (1-3) ◽

pp. 149-157 ◽

Author(s):

N. Kaufherr ◽

G.R. Fenske ◽

D.E. Busch ◽

P. Lin ◽

C. Deshpandey ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Evaporation Process ◽

Reactive Evaporation ◽

Activated Reactive Evaporation ◽

Spectroscopy Studies

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Rutherford backscattering spectroscopy (RBS) and medium energy ion scattering (MEIS)

Characterization of Nanoparticles ◽

10.1016/b978-0-12-814182-3.00023-7 ◽

2020 ◽

pp. 441-455

Author(s):

Lyudmila V. Goncharova

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Medium Energy ◽

Ion Scattering ◽

Medium Energy Ion Scattering

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Tungsten silicide composition analysis by Rutherford backscattering spectroscopy, Auger electron spectroscopy, and x-ray photoelectron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581240 ◽

1998 ◽

Vol 16 (3) ◽

pp. 1103-1105 ◽

Author(s):

C. A. Bradbury ◽

D. K. Fillmore

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Composition Analysis ◽

Tungsten Silicide ◽

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