The retrieval of a thin silver film dielectric constant by resonant approach

2020 ◽  
Vol 456 ◽  
pp. 124636
Author(s):  
R.S. Puzko ◽  
A.I. Ivanov ◽  
E.S. Lotkov ◽  
I.A. Rodionov ◽  
I.A. Ryzhikov ◽  
...  
2020 ◽  
Vol 31 (31) ◽  
pp. 314001 ◽  
Author(s):  
Linlin Shi ◽  
Jingcheng Song ◽  
Ye Zhang ◽  
Guohui Li ◽  
Wenyan Wang ◽  
...  

1985 ◽  
Vol 31 (4) ◽  
pp. 2548-2550 ◽  
Author(s):  
T. Inagaki ◽  
M. Motosuga ◽  
E. T. Arakawa ◽  
J. P. Goudonnet

1998 ◽  
Vol 31 (23) ◽  
pp. L73-L77 ◽  
Author(s):  
S Kundu ◽  
S Hazra ◽  
S Banerjee ◽  
M K Sanyal ◽  
S K Mandal ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (13) ◽  
pp. 2989
Author(s):  
Stefano Bellucci ◽  
Volodymyr Fitio ◽  
Andriy Bendziak ◽  
Iryna Yaremchuk ◽  
Yaroslav Bobitski

The resonant excitation of the surface plasmon–polariton waves by the prism structure, where a thin silver film was coated on the prism, was studied. New analytical relations between the angular and spectral sensitivities on the change of the medium refractive index, adjacent to the metal film, were obtained. In addition, the analytical relation between the full width at the half maximum of the spectral and angular resonance dependencies were found.


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