A novel projector ray-model for 3D measurement in fringe projection profilometry

2022 ◽  
Vol 149 ◽  
pp. 106818
Author(s):  
Yang Yang ◽  
Yupei Miao ◽  
Zewei Cai ◽  
Bruce Z. Gao ◽  
Xiaoli Liu ◽  
...  
2020 ◽  
Vol 125 ◽  
pp. 106063 ◽  
Author(s):  
Shichao Yang ◽  
Gaoxu Wu ◽  
Yanxue Wu ◽  
Jin Yan ◽  
Huifang Luo ◽  
...  

Measurement ◽  
2021 ◽  
Vol 182 ◽  
pp. 109675
Author(s):  
Huijie Zhao ◽  
Chenghao Liu ◽  
Hongzhi Jiang ◽  
Xudong Li

Optik ◽  
2021 ◽  
pp. 167895
Author(s):  
Jong-Chol Kang ◽  
Chol-Su Kim ◽  
Il-Jun Pak ◽  
Ju-Ryong Son ◽  
Chol-Sun Kim

2010 ◽  
Vol 48 (2) ◽  
pp. 218-225 ◽  
Author(s):  
Zhaoyang Wang ◽  
Dung A. Nguyen ◽  
John C. Barnes

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Parsa Omidi ◽  
Mohamadreza Najiminaini ◽  
Mamadou Diop ◽  
Jeffrey J. L. Carson

AbstractSpatial resolution in three-dimensional fringe projection profilometry is determined in large part by the number and spacing of fringes projected onto an object. Due to the intensity-based nature of fringe projection profilometry, fringe patterns must be generated in succession, which is time-consuming. As a result, the surface features of highly dynamic objects are difficult to measure. Here, we introduce multispectral fringe projection profilometry, a novel method that utilizes multispectral illumination to project a multispectral fringe pattern onto an object combined with a multispectral camera to detect the deformation of the fringe patterns due to the object. The multispectral camera enables the detection of 8 unique monochrome fringe patterns representing 4 distinct directions in a single snapshot. Furthermore, for each direction, the camera detects two π-phase shifted fringe patterns. Each pair of fringe patterns can be differenced to generate a differential fringe pattern that corrects for illumination offsets and mitigates the effects of glare from highly reflective surfaces. The new multispectral method solves many practical problems related to conventional fringe projection profilometry and doubles the effective spatial resolution. The method is suitable for high-quality fast 3D profilometry at video frame rates.


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