Extended-depth-of-field object detection with wavefront coding imaging system

2019 ◽  
Vol 125 ◽  
pp. 597-603 ◽  
Author(s):  
Liquan Dong ◽  
Haoyuan Du ◽  
Ming Liu ◽  
Yuejin Zhao ◽  
Xueyan Li ◽  
...  
2019 ◽  
Vol 436 ◽  
pp. 232-238
Author(s):  
Xutao Mo ◽  
Tao Zhang ◽  
Bin Wang ◽  
Xianshan Huang ◽  
Cuifang Kuang ◽  
...  

2018 ◽  
Vol 89 (10) ◽  
pp. 103101 ◽  
Author(s):  
Hongbo Xie ◽  
Lirong He ◽  
Lei Yang ◽  
Chensheng Mao ◽  
Meng Zhu ◽  
...  

2017 ◽  
Vol 392 ◽  
pp. 252-257 ◽  
Author(s):  
Zhaolou Cao ◽  
Chunjie Zhai ◽  
Jinhua Li ◽  
Fenglin Xian ◽  
Shixin Pei

2008 ◽  
Vol 28 (5) ◽  
pp. 870-875 ◽  
Author(s):  
潘超 Pan Chao ◽  
陈家璧 Chen Jiabi ◽  
张荣福 Zhang Rongfu ◽  
庄松林 Zhuang Songlin

2008 ◽  
Author(s):  
Chao Pan ◽  
Jiabi Chen ◽  
Dawei Zhang ◽  
Songlin Zhuang

2012 ◽  
Vol 54 (7) ◽  
pp. 1705-1711 ◽  
Author(s):  
Kai Xu ◽  
Yong-Seok Hwang ◽  
Sang-Shin Lee

Author(s):  
Daniel L. Barton ◽  
Jeremy A. Walraven ◽  
Edward R. Dowski ◽  
Rainer Danz ◽  
Andreas Faulstich ◽  
...  

Abstract A new imaging technique called Wavefront Coding allows real-time imaging of three-dimensional structures over a very large depth. Wavefront Coding systems combine aspheric optics and signal processing to achieve depth of fields ten or more times greater than that possible with traditional imaging systems. Understanding the relationships between traditional and modern imaging system design through Wavefront Coding is very challenging. In high performance imaging systems nearly all aspects of the system that could reduce image quality are carefully controlled. Modifying the optics and using signal processing can increase the amount of image information that can be recorded by microscopes. For a number of applications this increase in information can allow a single image to be used where a number of images taken at different object planes had been used before. Having very large depth of field and real-time imaging capability means that very deep structures such as surface micromachined MEMS can be clearly imaged with one image, greatly simplifying defect and failure analysis.


2018 ◽  
Vol 47 (10) ◽  
pp. 1011003
Author(s):  
周亮 ZHOU Liang ◽  
刘朝晖 LIU Zhao-hui ◽  
单秋莎 SHAN Qiu-sha ◽  
折文集 SHE Wen-ji

2013 ◽  
Author(s):  
Michael Gierlak ◽  
Stephanie Albrecht ◽  
Josef Kauer ◽  
E. Leverenz ◽  
Ingeborg E. Beckers

Sign in / Sign up

Export Citation Format

Share Document