Reconstruction of three-dimension digital rock guided by prior information with a combination of InfoGAN and style-based GAN

1975 ◽

Vol 33 ◽

pp. 292-293

Author(s):

D. E. Johnson

Keyword(s):

High Voltage ◽

Prior Information ◽

Block Diagram ◽

Three Dimensional ◽

Real Space ◽

Two Dimensional ◽

Efficient Manner ◽

Fourier Methods ◽

Tilt Series ◽

Methods Of Reconstruction

Increased specimen penetration; the principle advantage of high voltage microscopy, is accompanied by an increased need to utilize information on three dimensional specimen structure available in the form of two dimensional projections (i.e. micrographs). We are engaged in a program to develop methods which allow the maximum use of information contained in a through tilt series of micrographs to determine three dimensional speciman structure.In general, we are dealing with structures lacking in symmetry and with projections available from only a limited span of angles (±60°). For these reasons, we must make maximum use of any prior information available about the specimen. To do this in the most efficient manner, we have concentrated on iterative, real space methods rather than Fourier methods of reconstruction. The particular iterative algorithm we have developed is given in detail in ref. 3. A block diagram of the complete reconstruction system is shown in fig. 1.

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Local thickness determination by Electron Energy Loss Spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100172450 ◽

1994 ◽

Vol 52 ◽

pp. 944-945

Author(s):

Suichu Luo ◽

John R. Dunlap ◽

Richard W. Williams ◽

David C. Joy

Keyword(s):

Energy Loss ◽

Analytical Electron Microscopy ◽

Mean Free Path ◽

Single Scattering ◽

Specimen Thickness ◽

Three Dimension ◽

Angular Correction ◽

Electron Intensity ◽

Image Position ◽

Inelastic Mean Free Path

In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we present a method based on three-dimension Poisson statistics, which takes into account both the inelastic and elastic mixed angular correction.The three-dimension Poisson formula is given by:where I is the unscattered electron intensity; t is the sample thickness; λi and λe are the inelastic and elastic scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively ; F(E) is the single scattering normalized energy loss distribution; D(E,θ) is the plural scattering distribution,

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