scholarly journals Three-dimensional atom probe analysis of carbon distribution in low-temperature bainite

2004 ◽  
Vol 50 (10) ◽  
pp. 1277-1281 ◽  
Author(s):  
M. Peet ◽  
S.S. Babu ◽  
M.K. Miller ◽  
H.K.D.H. Bhadeshia
Keyword(s):  
Low Temperature ◽  
Three Dimensional ◽  
Atom Probe ◽  
Carbon Distribution ◽  
Probe Analysis ◽  
Atom Probe Analysis

Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis

2004 ◽  
Vol 52 (10) ◽  
pp. 2847-2862 ◽  
Author(s):  
D.J. Larson ◽  
A.K. Petford-Long ◽  
Y.Q Ma ◽  
A. Cerezo
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Information Storage ◽  
Storage Materials ◽  
Probe Analysis ◽  
Atom Probe Analysis

scholarly journals Atom Probe Analysis of Ex Situ Gas-Charged Stable Hydrides

2017 ◽  
Vol 23 (2) ◽  
pp. 307-313 ◽  
Author(s):  
Daniel Haley ◽  
Paul A. J. Bagot ◽  
Michael P. Moody
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Ex Situ ◽  
Native Oxide ◽  
Probe Analysis ◽  
Atom Probe Tomography Analysis ◽  
Hydrogen Analysis ◽  
Atom Probe Analysis

AbstractIn this work, we report on the atom probe tomography analysis of two metallic hydrides formed by pressurized charging using an ex situ hydrogen charging cell, in the pressure range of 200–500 kPa (2–5 bar). Specifically we report on the deuterium charging of Pd/Rh and V systems. Using this ex situ system, we demonstrate the successful loading and subsequent atom probe analysis of deuterium within a Pd/Rh alloy, and demonstrate that deuterium is likely present within the oxide–metal interface of a native oxide formed on vanadium. Through these experiments, we demonstrate the feasibility of ex situ hydrogen analysis for hydrides via atom probe tomography, and thus a practical route to three-dimensional imaging of hydrogen in hydrides at the atomic scale.

Three-dimensional atom probe analysis and magnetic properties of Fe 85 Cu 1 Si 2 B 8 P 4 melt spun ribbons

2016 ◽  
Vol 401 ◽  
pp. 1123-1129 ◽  
Author(s):  
S. Jafari ◽  
A. Beitollahi ◽  
B. Eftekhari Yekta ◽  
T. Ohkubo ◽  
Viktoria Budinsky ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Three Dimensional ◽  
Atom Probe ◽  
Probe Analysis ◽  
Melt Spun ◽  
Melt Spun Ribbons ◽  
Atom Probe Analysis

Three-dimensional atom probe analysis of chromium- and copper-added nitriding steel

2007 ◽  
Vol 39 (2-3) ◽  
pp. 232-236 ◽  
Author(s):  
J. Takahashi ◽  
K. Kawasaki ◽  
K. Kawakami ◽  
M. Sugiyama
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Probe Analysis ◽  
Atom Probe Analysis

The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes

2021 ◽  
pp. 1-9
Author(s):  
Jonathan Op de Beeck ◽  
Jeroen E. Scheerder ◽  
Brian P. Geiser ◽  
Joseph H. Bunton ◽  
Robert M. Ulfig ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Heterogeneous Systems ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Scanning Probe ◽  
Spherical Cap ◽  
Essential Information ◽  
Probe Analysis ◽  
Actual Shape ◽  
Atom Probe Analysis

Reliable spatially resolved compositional analysis through atom probe tomography requires an accurate placement of the detected ions within the three-dimensional reconstruction. Unfortunately, for heterogeneous systems, traditional reconstruction protocols are prone to position some ions incorrectly. This stems from the use of simplified projection laws which treat the emitter apex as a spherical cap, although the actual shape may be far more complex. For instance, sampled materials with compositional heterogeneities are known to develop local variations in curvature across the emitter due to their material phase specific evaporation fields. This work provides three pivotal precursors to improve the spatial accuracy of the reconstructed volume in such cases. First, we show scanning probe microscopy enables the determination of the local curvature of heterogeneous emitters, thus providing the essential information for a more advanced reconstruction considering the actual shape. Second, we demonstrate the cyclability between scanning probe characterization and atom probe analysis. This is a key ingredient of more advanced reconstruction protocols whereby the characterization of the emitter topography is executed at multiple stages of the atom probe analysis. Third, we show advances in the development of an electrostatically driven reconstruction protocol which are expected to enable reconstruction based on experimental tip shapes.

Three‐dimensional atom probe analysis of a sputter‐deposited Co–Cr thin film

1995 ◽  
Vol 66 (13) ◽  
pp. 1686-1688 ◽  
Author(s):  
K. Hono ◽  
K. Yeh ◽  
Y. Maeda ◽  
T. Sakurai
Keyword(s):  
Thin Film ◽  
Three Dimensional ◽  
Atom Probe ◽  
Probe Analysis ◽  
Sputter Deposited ◽  
Atom Probe Analysis

Three-dimensional atom probe analysis of heavily drawn steel wires by probing perpendicular to the pearlitic lamellae

2009 ◽  
Vol 109 (2) ◽  
pp. 193-199 ◽  
Author(s):  
Jun Takahashi ◽  
Toshimi Tarui ◽  
Kazuto Kawakami
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Steel Wires ◽  
Probe Analysis ◽  
Atom Probe Analysis
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