Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

2018 ◽  
Vol 153 ◽  
pp. 109-113
Author(s):  
Georges Beainy ◽  
Reynald Alcotte ◽  
Franck Bassani ◽  
Mickaël Martin ◽  
Adeline Grenier ◽  
...  
2019 ◽  
Vol 125 (7) ◽  
pp. 073902 ◽  
Author(s):  
Hiroto Oomae ◽  
Miyuki Shinoda ◽  
Joel T. Asubar ◽  
Kai Sato ◽  
Hideyuki Toyota ◽  
...  

2019 ◽  
Vol 236 ◽  
pp. 92-95 ◽  
Author(s):  
Hisham Aboulfadl ◽  
Fabian Seifried ◽  
Michael Stüber ◽  
Frank Mücklich

2012 ◽  
Vol 520 (13) ◽  
pp. 4362-4368 ◽  
Author(s):  
L.J.S. Johnson ◽  
M. Thuvander ◽  
K. Stiller ◽  
M. Odén ◽  
L. Hultman

2012 ◽  
Vol 9 (3-4) ◽  
pp. 723-726
Author(s):  
Robert Nicholas ◽  
David Diercks ◽  
Matthew Kane

Author(s):  
B. P. Geiser ◽  
J. Schneir ◽  
J. Roberts ◽  
S. Wiener ◽  
D. J. Larson ◽  
...  

2013 ◽  
Vol 19 (S2) ◽  
pp. 1028-1029
Author(s):  
A.D. Giddings ◽  
T.J. Prosa ◽  
T.F. Kelly ◽  
D.J. Larson

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2011 ◽  
Vol 133 (5) ◽  
pp. 1451-1458 ◽  
Author(s):  
Rodrigue Lardé ◽  
Etienne Talbot ◽  
Philippe Pareige ◽  
Herrade Bieber ◽  
Guy Schmerber ◽  
...  

2010 ◽  
Vol 16 (S2) ◽  
pp. 1526-1527
Author(s):  
SR Spurgeon ◽  
CR Winkler ◽  
BJ Kirby ◽  
CL Johnson ◽  
DN Seidman ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


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