Spatial Distribution Maps for Atom Probe Tomography

2006 ◽  
Author(s):  
B. P. Geiser ◽  
J. Schneir ◽  
J. Roberts ◽  
S. Wiener ◽  
D. J. Larson ◽  
...  
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Distribution Maps

Spatial Distribution Maps for Atom Probe Tomography

2007 ◽  
Vol 13 (6) ◽  
pp. 437-447 ◽  
Author(s):  
Brian P. Geiser ◽  
Thomas F. Kelly ◽  
David J. Larson ◽  
Jason Schneir ◽  
Jay P. Roberts
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Detection Efficiency ◽  
Structural Information ◽  
Atom Probe ◽  
Dark Field ◽  
Distribution Functions ◽  
Orientation Relationships ◽  
Distribution Maps ◽  
Space Technique

A real-space technique for finding structural information in atom probe tomographs, spatial distribution maps (SDM), is described. The mechanics of the technique are explained, and it is then applied to some test cases. Many applications of SDM in atom probe tomography are illustrated with examples including finding crystal lattices, correcting lattice strains in reconstructed images, quantifying trajectory aberrations, quantifying spatial resolution, quantifying chemical ordering, dark-field imaging, determining orientation relationships, extracting radial distribution functions, and measuring ion detection efficiency.

Refining Spatial Distribution Maps for Atom Probe Tomography via Data Dimensionality Reduction Methods

2012 ◽  
Vol 18 (5) ◽  
pp. 941-952 ◽  
Author(s):  
Santosh K. Suram ◽  
Krishna Rajan
Keyword(s):  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Structural Information ◽  
Three Dimensional ◽  
Relevant Information ◽  
Atom Probe ◽  
Mathematical Framework ◽  
Frequency Distributions ◽  
Distribution Maps ◽  
Singular Vectors

AbstractA mathematical framework based on singular value decomposition is used to analyze the covariance among interatomic frequency distributions in spatial distribution maps (SDMs). Using this approach, singular vectors that capture the covariance within the SDM data are obtained. The structurally relevant singular vectors (SRSVs) are identified. Using the SRSVs, we extract information from z-SDMs that not only captures the offset between the atomic planes but also captures the covariance in the atomic structure among the neighborhood atomic planes. These refined z-SDMs classify the Δ(Δz) slices in the SDMs into structurally relevant information, noise, and aberrations. The SRSVs are used to construct refined xy-SDMs that provide enhanced structural information for three-dimensional atom probe tomography.

Informatics for Quantitative Analysis of Atom Probe Tomography Images

2009 ◽  
Vol 1231 ◽  
Author(s):  
Santosh K Suram ◽  
Krishna Rajan
Keyword(s):  
Data Mining ◽  
Spatial Distribution ◽  
Quantitative Analysis ◽  
Atom Probe Tomography ◽  
Structural Information ◽  
Three Dimensional ◽  
Atomic Plane ◽  
Atom Probe ◽  
Distribution Maps

AbstractAn informatics based approach to extract further refinements on the crystallographic information embedded in the Spatial Distribution Maps (SDMs) has been developed. The data mining based methods to generate and interpret spectra that de-convolute the SDMs are discussed. This work has resulted in a method to generate SDMs that can map three-dimensional crystallographic information as opposed to existing methods that map structural information on only one atomic plane at a time. The broader implications of this work on enhancing the interpretation and resolution of structural information in atom probe tomography studies is also discussed.

Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

2018 ◽  
Vol 153 ◽  
pp. 109-113
Author(s):  
Georges Beainy ◽  
Reynald Alcotte ◽  
Franck Bassani ◽  
Mickaël Martin ◽  
Adeline Grenier ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Direct Examination

Spatial distribution of substitutional Mn-As clusters in ferromagnetic (Zn,Sn,Mn)As2 thin films revealed by image reconstruction of atom probe tomography data

2019 ◽  
Vol 125 (7) ◽  
pp. 073902 ◽  
Author(s):  
Hiroto Oomae ◽  
Miyuki Shinoda ◽  
Joel T. Asubar ◽  
Kai Sato ◽  
Hideyuki Toyota ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Distribution ◽  
Image Reconstruction ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Tomography Data

scholarly journals Spatial Resolution in Atom Probe Tomography

2010 ◽  
Vol 16 (1) ◽  
pp. 99-110 ◽  
Author(s):  
Baptiste Gault ◽  
Michael P. Moody ◽  
Frederic De Geuser ◽  
Alex La Fontaine ◽  
Leigh T. Stephenson ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Atom Probe Tomography ◽  
Tomographic Reconstruction ◽  
Measurement Techniques ◽  
Atom Probe ◽  
Absolute Value ◽  
Distribution Maps ◽  
Analysis Methodology ◽  
Sufficient Proof

AbstractThis article addresses gaps in definitions and a lack of standard measurement techniques to assess the spatial resolution in atom probe tomography. This resolution is known to be anisotropic, being better in-depth than laterally. Generally the presence of atomic planes in the tomographic reconstruction is considered as being a sufficient proof of the quality of the spatial resolution of the instrument. Based on advanced spatial distribution maps, an analysis methodology that interrogates the local neighborhood of the atoms within the tomographic reconstruction, it is shown how both the in-depth and the lateral resolution can be quantified. The influences of the crystallography and the temperature are investigated, and models are proposed to explain the observed results. We demonstrate that the absolute value of resolution is specimen specific.

scholarly journals Applications of Spatial Distribution Maps for Advanced Atom Probe Reconstruction and Data Analysis

2009 ◽  
Vol 15 (S2) ◽  
pp. 246-247 ◽  
Author(s):  
M Moody ◽  
B Gault ◽  
L Stephenson ◽  
S Ringer
Keyword(s):  
Spatial Distribution ◽  
Data Analysis ◽  
Atom Probe ◽  
Distribution Maps

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals Correlating nanoscale secondary ion mass spectrometry and atom probe tomography analysis of uranium enrichment in metallic nuclear fuel

The Analyst ◽  
2021 ◽  
Vol 146 (1) ◽  
pp. 69-74
Author(s):  
Elizabeth Kautz ◽  
John Cliff ◽  
Timothy Lach ◽  
Dallas Reilly ◽  
Arun Devaraj
Keyword(s):  
Mass Spectrometry ◽  
Nuclear Fuel ◽  
Atom Probe Tomography ◽  
Secondary Ion Mass Spectrometry ◽  
Atom Probe ◽  
Uranium Enrichment ◽  
Length Scales ◽  
Atom Probe Tomography Analysis ◽  
Secondary Ion ◽  
Tomography Analysis

235U enrichment in a metallic nuclear fuel was measured via NanoSIMS and APT, allowing for a direct comparison of enrichment across length scales and resolutions.

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