Breath methane detection based on all-optical photoacoustic spectrometer

2017 ◽  
Vol 239 ◽  
pp. 1257-1260 ◽  
Author(s):  
Xuefeng Mao ◽  
Peichao Zheng ◽  
Xiaofa Wang ◽  
Suzhen Yuan
2011 ◽  
Vol 153 (1) ◽  
pp. 214-218 ◽  
Author(s):  
Qiaoyun Wang ◽  
Jianwei Wang ◽  
Liang Li ◽  
Qingxu Yu

2016 ◽  
Vol 232 ◽  
pp. 251-256 ◽  
Author(s):  
Xuefeng Mao ◽  
Xinlei Zhou ◽  
Zhengfeng Gong ◽  
Qingxu Yu

2013 ◽  
Vol 38 (10) ◽  
pp. 1672 ◽  
Author(s):  
Grzegorz Gruca ◽  
Kier Heeck ◽  
Jan Rector ◽  
Davide Iannuzzi

2018 ◽  
Vol 43 (20) ◽  
pp. 5038 ◽  
Author(s):  
Ke Chen ◽  
Zhihao Yu ◽  
Zhenfeng Gong ◽  
Qingxu Yu

Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.


1983 ◽  
Vol 44 (C6) ◽  
pp. C6-165-C6-170
Author(s):  
G. Rousset ◽  
J. P. Monchalin ◽  
L. Bertrand

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
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