Characterization of PIII textured industrial multicrystalline silicon solar cells

Solar Energy ◽  
2012 ◽  
Vol 86 (10) ◽  
pp. 3004-3008 ◽  
Author(s):  
Jie Liu ◽  
Bangwu Liu ◽  
Zenan Shen ◽  
Jinhu Liu ◽  
Sihua Zhong ◽  
...  
Keyword(s):  
Solar Cells ◽  
Multicrystalline Silicon ◽  
Silicon Solar Cells

Characterization of laser edge isolation in multicrystalline silicon solar cells

2010 ◽  
Author(s):  
C.-S. Jiang ◽  
H.R. Moutinho ◽  
S. Johnston ◽  
Y. Yan ◽  
M.M. Al-Jassim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Multicrystalline Silicon ◽  
Silicon Solar Cells

Light Beam Induced Current Mapping of mc-Si Solar Cells: Influence of Grain Boundaries and Intragrain Defects

2010 ◽  
Vol 1268 ◽  
Author(s):  
Juan Jimenez ◽  
Benito Moralejo ◽  
Vanesa Hortelano ◽  
Miguel Ángel González ◽  
Oscar Martínez ◽  
...  
Keyword(s):  
Solar Cells ◽  
Grain Boundaries ◽  
Structural Heterogeneity ◽  
Multicrystalline Silicon ◽  
Silicon Solar Cells ◽  
Induced Current ◽  
Electrical Parameters ◽  
Si Solar Cells ◽  
Reflected Light

AbstractThe photovoltaic market is currently dominated by multicrystalline silicon. However, this material is characterized by intrinsic structural heterogeneity due to point defects, dislocations and grain boundaries. In order to improve the cell performance the control of the electrical properties of the grain boundaries and dislocations is required. The laser beam induced current technique allows the estimation of the variations of the charge capture rates due to the different trapping centers, and is a powerful tool for the characterization of multicrystalline silicon solar cells. Nevertheless, one has to control the reflected light in order to obtain a reliable estimation of the electrical parameters.

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