scanning probe microscopy
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2022 ◽  
Vol 12 (1) ◽  
Author(s):  
Iaroslav Gaponenko ◽  
Salia Cherifi-Hertel ◽  
Ulises Acevedo-Salas ◽  
Nazanin Bassiri-Gharb ◽  
Patrycja Paruch

AbstractThe wealth of properties in functional materials at the nanoscale has attracted tremendous interest over the last decades, spurring the development of ever more precise and ingenious characterization techniques. In ferroelectrics, for instance, scanning probe microscopy based techniques have been used in conjunction with advanced optical methods to probe the structure and properties of nanoscale domain walls, revealing complex behaviours such as chirality, electronic conduction or localised modulation of mechanical response. However, due to the different nature of the characterization methods, only limited and indirect correlation has been achieved between them, even when the same spatial areas were probed. Here, we propose a fast and unbiased analysis method for heterogeneous spatial data sets, enabling quantitative correlative multi-technique studies of functional materials. The method, based on a combination of data stacking, distortion correction, and machine learning, enables a precise mesoscale analysis. When applied to a data set containing scanning probe microscopy piezoresponse and second harmonic generation polarimetry measurements, our workflow reveals behaviours that could not be seen by usual manual analysis, and the origin of which is only explainable by using the quantitative correlation between the two data sets.


Author(s):  
Yue Liu ◽  
Bingxue Yu ◽  
Hongli Wang ◽  
Kaiyang Zeng

The contact mode voltage modulated scanning probe microscopy (SPM) techniques, such as switching spectroscopy piezoresponse force microscope (SS-PFM), are powerful tools for detecting local electromechanical behaviors. However, interpreting their signals,...


Author(s):  
Д.А. Киселев ◽  
А.В. Павленко ◽  
С.П. Зинченко

The properties of c-oriented thin films Sr0.5Ba0.5Nb2O6 grown on a Si(001) (p-type) substrate with a pre-deposited Ba0.2Sr0.8TiO3 layer were studied using scanning probe microscopy and dielectric spectroscopy. It is established that the films Sr0.5Ba0.5Nb2O6 are characterized by low surface roughness (less than 6 nm), average crystallite size 93 nm. It is shown that there is spontaneous polarization in the film directed from its surface to the substrate, which caused the manifestation of the field effect for the case of the Si substrate with p-type conductivity without external field effect. Differences in the magnitude of the surface potential signal for regions polarized by an external electric field of different polarities (+10 and −10 V), as well as in their relaxation to the initial state, are revealed. The reasons for the established patterns are discussed.


Author(s):  
Григорий Иосифович Свердлик ◽  
Анжела Юрьевна Атаева ◽  
Амонд Рафаэлович Атаев ◽  
Елена Александровна Хадзарагова ◽  
Людмила Тотразовна Вазиева

В представленной работе рассмотрены методы определения размеров наночастиц различными способами. Определен эффективный метод нахождения возможных вариантов. Содержатся сведения о многообразии этих методов и о приёмах их реализации. Выбрана и проанализирована информация по различным методам и исследованиям. Рассмотрены принципиально отличающиеся методы нахождения размеров наночастиц. Одними из перспективных методов являются бесконтактные (оптические). Подвергнуты анализу и приведены диапазоны крупности исследуемых частиц при использовании методов: оптической микроскопии, электронной микроскопии, сканирующей зондовой микроскопии. Описаны принципы работы и возможные схемы установок для изучения исследуемого материала. Более подробно освещен седиментационный метод с применением центрифугирования и рентгеновского принципа детекции. Отмечены его преимущества перед другими методами. Приведены примеры его использования на экспериментальной установке, позволяющей получать дифференциальные и интегральные характеристики в различных базисах, которые позволяют анализировать распределение частиц по крупности при гранулометрическом исследовании материалов, включая наноматериалы. In the presented work, various methods for determining the size of nanoparticles are considered. An effective method for finding possible options has been determined. Information on various methods and studies was selected and analyzed. Fundamentally different methods for finding the sizes of nanoparticles are considered. Non-contact (optical) methods are the most promising. The particle size ranges of the investigated particles are analyzed and presented using the next methods: optical microscopy, electron microscopy, scanning probe microscopy. The principles of operation and possible schemes of installations for studying the material under study are described. The sedimentation method, using centrifugation and the X-ray principle of detection, is described in more detail. Its advantages over other methods are noted. Examples are given of its use in an experimental setup that allows obtaining differential and integral characteristics in various bases, which make it possible to analyze the particle size distribution in the granulometric study of materials, including nanomaterials.


2021 ◽  
Vol 7 ◽  
Author(s):  
Céline Noël ◽  
Lennaert Wouters ◽  
Kristof Paredis ◽  
Umberto Celano ◽  
Thomas Hantschel

The ever-increasing complexity of semiconductor devices requires innovative three-dimensional materials characterization techniques for confined volumes. Multiple atomic force microscopy (AFM)-based methodologies, using a slice-and-measure approach have been proposed to meet this demand. They consist of scanning AFM probes that erode locally the sample’s material at a relatively high load while sensing with the secondary AFM channel, thus accessing in-depth information compared to the standard surface-limited analysis. Nonetheless, the rapid tip apex wear caused by the high forces involved, and the debris accumulation at the tip apex and inside/around the scan area, have been identified as major limitations to the accuracy and repeatability of the existing tomographic AFM sensing methods. Here we explore the use of oil as a suitable medium to overcome some of the issues such as the scan debris accumulation and the removal variability when working in air. We show how the use of oil preserves the tomographic operation while improving the efficiency in material removal for large depth sensing at a reduced debris accumulation. This is reported by comparing the results between air and oil environments, where the removal rate, depth accuracy, and tip-contamination are benchmarked. Finally, we provide the first demonstration of electrical AFM sensing using scanning spreading resistance microscopy (SSRM) in oil.


2021 ◽  
Vol 8 (3) ◽  
Author(s):  
Awatif I. Muhammed ◽  
Quraish A. Kazem ◽  
Rana A. Kamal ◽  
Ahmed J. Issa ◽  
Inas F. Abed ◽  
...  

Nano peel solution was prepared using Sol-gel technology at a temperature of (80) Celsius. A number of tests were performed to describe the properties and structure of Nano material, including scanning probe microscopy (SPM), which showed the symmetric cumulative distribution of the solution Nanoparticles and the average grain size equal to 64.5 nm and the identical distribution of the Nanoparticles with a diameter of 37.75 nanometers, with a measurement area ranging between (1531.23-1558.19) nanometers. Nano-solution analyzed with a scanning electron microscope (SEM), Inspect type (S50), with a magnification power up to X2000, where dense flakes of Nano particles with a diameter of (50 ± 10) nanometers were observed. The antibacterial activity of Nano-solution by using gram- positive bacteria St. aurous and gram-negative E. coli show the inhibition diameter of (St. aurous) was 27 mm and 25 mm in (E. coli).


Author(s):  
Gerd Wuebbeler ◽  
Manuel Marschall ◽  
Eckart Rühl ◽  
Bernd Kaestner ◽  
Clemens Elster

Abstract Nano-Fourier-transform infrared spectroscopy (nano-FTIR) combines infrared spectroscopy with scanning probe microscopy (SPM) techniques and enables spectroscopic imaging of molecular and electronic properties of matter at nanometer spatial resolution. The spectroscopic imaging can be used to derive chemical mappings, i.e., the spatial distribution of concentrations of the species contained in a given sample. However, due to the sequential scanning principle underlying SPM, recording the complete spectrum over a large spatial area leads to long measurement times. Furthermore, the acquired spectrum often contains additional signals from species and lineshape effects that are not explicitly accounted for. A compressive chemical mapping approach is proposed for undersampled nano-FTIR data that utilizes sparsity of these additional signals in the spectral domain. The approach combines a projection technique with standard compressed sensing, followed by a spatially regularized regression. Using real nano-FTIR measurements superimposed by simulated interferograms representing the chemical mapping of the contained species, it is demonstrated that the proposed procedure performs well even in cases in which the simulated interferograms and the sparse additional signals exhibit a strong spectral overlap.


Author(s):  
Charlotte Ovenden ◽  
Ian Farrer ◽  
Maurice S Skolnick ◽  
Jon Heffernan

Abstract Scanning probe microscopy assisted local anodic oxidation offers advantages over other semiconductor fabrication techniques as it is a low contamination method. We demonstrate the fabrication of deep and highly reproducible nanohole arrays on InP using local anodic oxidation. Nanohole and nano-oxide mound radius and depth are controlled independently by altering atomic force microscope tip bias and humidity, with a maximum nanohole depth of 15.6 ± 1.2 nm being achieved. Additionally, the effect of tip write speed on oxide line formation is compared for n-type, p-type and semi-insulating substrates, which shows that n-type InP oxidises at a slower rate that semi-insulated or p-type InP. Finally, we calculate the activation energy for LAO of semi-insulating InP to be 0.4 eV, suggesting the oxidation mechanism is similar to that which occurs during plasma oxidation.


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