Modeling observed capacitance–voltage hysteresis in metal–SiO2-thin film organic semiconductor devices
2006 ◽
Vol 50
(6)
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pp. 1097-1104
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2016 ◽
Vol 59
(7)
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pp. 589-608
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Keyword(s):
2010 ◽
Vol 57
(1)
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pp. 153-156
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2011 ◽
Vol 54
(4)
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pp. 826-829
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