scholarly journals RETRACTED: Cross- and in-plane thermal conductivity of AlN thin films measured using differential 3-omega method

2017 ◽  
Vol 320 ◽  
pp. 91-96 ◽  
Author(s):  
Manuel Bogner ◽  
Günther Benstetter ◽  
Yong Qing Fu
2008 ◽  
Vol 2008.61 (0) ◽  
pp. 291-292
Author(s):  
Makoto TAKIISHI ◽  
Saburo TANAKA ◽  
Hiroshi TSUKAMOTO ◽  
Koji MIYAZAKI

2021 ◽  
Vol 2057 (1) ◽  
pp. 012108
Author(s):  
E S Makarova ◽  
A V Novotelnova

Abstract Using the method of computer simulation, the uncertainty of measurements of the thermal conductivity of silicon, which is often used as substrates, and also thin films based on bismuth, is estimated. The influence of the application of an additional dielectric layer between the thermoelectric film and the resistive heater on the measurement results is shown.


Author(s):  
Amine Abdelkader Guermoudi ◽  
Pierre Yves Cresson ◽  
Amaria Ouldabbes ◽  
Ghizlane Boussatour ◽  
Tuami Lasri

2010 ◽  
Vol 39 (9) ◽  
pp. 1621-1626 ◽  
Author(s):  
A. Jacquot ◽  
F. Vollmer ◽  
B. Bayer ◽  
M. Jaegle ◽  
D. G. Ebling ◽  
...  

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