Structures of Co and Pt nanoclusters on a thin film of Al2O3/NiAl(100) from reflection high-energy electron diffraction and scanning-tunnelling microscopy

Surface Science ◽

10.1016/j.susc.2007.03.016 ◽

2007 ◽

Vol 601 (10) ◽

pp. 2139-2146 ◽

Author(s):

M.F. Luo ◽

W.H. Wen ◽

C.S. Lin ◽

C.I. Chiang ◽

S.D. Sartale ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

High Energy ◽

Scanning Tunnelling Microscopy ◽

Energy Electron ◽

High Energy Electron ◽

Pt Nanoclusters ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Investigation of Si?Au vicinal surfaces using scanning tunnelling microscopy and reflection high-energy electron diffraction

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01686.x ◽

2006 ◽

Vol 224 (1) ◽

pp. 125-127

Author(s):

P. MAZUREK ◽

K. PAPROCKI ◽

Z. MITURA

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Scanning Tunnelling Microscopy ◽

Energy Electron ◽

High Energy Electron ◽

Vicinal Surfaces ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.3.180 ◽

2011 ◽

pp. 180-211 ◽

Author(s):

P.G. Staib

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Real Time ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

Surface Monitoring

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Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.1.3 ◽

2011 ◽

pp. 3-28 ◽

Author(s):

G. Koster

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

In Situ Characterization

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Summary Abstract: Application of reflection high‐energy electron diffraction to thin‐film growth and characterization

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574910 ◽

1987 ◽

Vol 5 (4) ◽

pp. 2027-2028 ◽

Author(s):

P. I. Cohen ◽

P. R. Pukite

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron

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Fe3O4(111) formation on a reduced α-Fe2O3(112̄3) substrate: a low-energy electron diffraction and scanning tunnelling microscopy study

Surface Science ◽

10.1016/s0039-6028(99)01093-6 ◽

2000 ◽

Vol 445 (1) ◽

pp. 11-17 ◽

Author(s):

R.A. Fellows ◽

A.R. Lennie ◽

H. Raza ◽

C.L. Pang ◽

G. Thornton ◽

...

Keyword(s):

Electron Diffraction ◽

Microscopy Study ◽

Scanning Tunnelling Microscopy ◽

Energy Electron ◽

Low Energy Electron Diffraction ◽

Scanning Tunnelling ◽

Tunnelling Microscopy ◽

Low Energy Electron

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Thin-film crystallography using reflection high-energy electron diffraction ‘‘rod intensity profiles’’: Ni/Si(111)

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.584260 ◽

1988 ◽

Vol 6 (4) ◽

pp. 1336 ◽

Author(s):

P. A. Bennett

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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Reflection high energy electron diffraction and scanning tunnelling microscopy study of single-domain growth during silicon molecular beam epitaxy on Si(001)

Thin Solid Films ◽

10.1016/0040-6090(89)90451-3 ◽

1989 ◽

Vol 183 (1-2) ◽

pp. 263-271 ◽

Author(s):

A.J. Hoeven ◽

E.J. Van Loenen ◽

D. Dijkkamp ◽

J.M. Lenssinck ◽

J. Dieleman

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

Microscopy Study ◽

High Energy ◽

Single Domain ◽

Domain Growth ◽

High Energy Electron ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Dynamical Observation of the Thin Film Growth Processes Using Reflective High-Energy Electron Diffraction(RHEED).

Materia Japan ◽

10.2320/materia.35.53 ◽

1996 ◽

Vol 35 (1) ◽

pp. 53-59

Author(s):

Yoshishige Suzuki

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

Growth Processes

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Surface and Thin Film Growth Studied by Reflection High Energy Electron Diffraction

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_19 ◽

1989 ◽

pp. 267-282 ◽

Author(s):

P. J. Dobson

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron

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Adsorption geometry of glycine on Cu(001) determined with low-energy electron diffraction and scanning tunnelling microscopy

Chinese Physics ◽

10.1088/1009-1963/11/8/317 ◽

2002 ◽

Vol 11 (8) ◽

pp. 839-845 ◽

Author(s):

Ge Si-Ping ◽

Zhao Xue-Ying ◽

Gai Zheng ◽

Zhao Ru-Guang ◽

Yang Wei-Sheng

Keyword(s):

Electron Diffraction ◽

Scanning Tunnelling Microscopy ◽

Energy Electron ◽

Low Energy Electron Diffraction ◽

Scanning Tunnelling ◽

Tunnelling Microscopy ◽

Low Energy Electron ◽

Adsorption Geometry

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