scholarly journals A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

2017 ◽  
Vol 173 ◽  
pp. 76-83 ◽  
Author(s):  
H.G. Brown ◽  
R. Ishikawa ◽  
G. Sánchez-Santolino ◽  
N.R. Lugg ◽  
Y. Ikuhara ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
New Method ◽  
Bright Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Field Imaging

scholarly journals Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

2010 ◽  
Vol 16 (S2) ◽  
pp. 80-81 ◽  
Author(s):  
SD Findlay ◽  
N Shibata ◽  
H Sawada ◽  
E Okunishi ◽  
Y Kondo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Bright Field ◽  
Microscopy Imaging ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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