Bright-field imaging of compound semiconductors using aberration-corrected scanning transmission electron microscopy

Compound Semiconductors ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Field Imaging ◽

Dynamics of annular bright field imaging in scanning transmission electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2010.04.004 ◽

2010 ◽

Vol 110 (7) ◽

pp. 903-923 ◽

Cited By ~ 277

Author(s):

S.D. Findlay ◽

N. Shibata ◽

H. Sawada ◽

E. Okunishi ◽

Y. Kondo ◽

...

Keyword(s):

Electron Microscopy ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Field Imaging

A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

Ultramicroscopy ◽

10.1016/j.ultramic.2016.11.024 ◽

2017 ◽

Vol 173 ◽

pp. 76-83 ◽

Cited By ~ 16

Author(s):

H.G. Brown ◽

R. Ishikawa ◽

G. Sánchez-Santolino ◽

N.R. Lugg ◽

Y. Ikuhara ◽

...

Keyword(s):

Electron Microscopy ◽

New Method ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Field Imaging

Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy

Journal of Materials Research ◽

10.1557/jmr.2016.297 ◽

2016 ◽

Vol 32 (5) ◽

pp. 921-927 ◽

Cited By ~ 3

Author(s):

David J. Smith ◽

Jing Lu ◽

Toshihiro Aoki ◽

Martha R. McCartney ◽

Yong-Hang Zhang

Keyword(s):

Electron Microscopy ◽

Compound Semiconductors ◽

Transmission Electron ◽

Scanning Transmission ◽

Image Position ◽

Abstract

Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM)

Micron ◽

10.1016/j.micron.2011.10.007 ◽

2012 ◽

Vol 43 (4) ◽

pp. 538-544 ◽

Cited By ~ 50

Author(s):

Eiji Okunishi ◽

Hidetaka Sawada ◽

Yukihito Kondo

Keyword(s):

Electron Microscopy ◽

Experimental Study ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study

Ultramicroscopy ◽

10.1016/j.ultramic.2011.03.005 ◽

2011 ◽

Vol 111 (8) ◽

pp. 1144-1154 ◽

Cited By ~ 34

Author(s):

S.D. Findlay ◽

N.R. Lugg ◽

N. Shibata ◽

L.J. Allen ◽

Y. Ikuhara

Keyword(s):

Electron Microscopy ◽

Theoretical Study ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission

Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

Microscopy and Microanalysis ◽

10.1017/s143192761005484x ◽

2010 ◽

Vol 16 (S2) ◽

pp. 80-81 ◽

Cited By ~ 1

Author(s):

SD Findlay ◽

N Shibata ◽

H Sawada ◽

E Okunishi ◽

Y Kondo ◽

...

Keyword(s):

Electron Microscopy ◽

Bright Field ◽

Microscopy Imaging ◽

Transmission Electron ◽

Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Image Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2012.04.018 ◽

2012 ◽

Vol 43 (10) ◽

pp. 1068-1072 ◽

Cited By ~ 1

Author(s):

Paul D. Robb ◽

Michael Finnie ◽

Alan J. Craven

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Short Period ◽

Scanning Transmission ◽

Short Period Superlattices ◽

Advances in Imaging and Electron Physics - Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy ◽

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

10.1016/s1076-5670(08)01008-2 ◽

2008 ◽

pp. 283-325 ◽

Cited By ~ 3

Author(s):

Angus I. Kirkland ◽

Peter D. Nellist ◽

Lan-Yun Chang ◽

Sarah J. Haigh

Keyword(s):

Electron Microscopy ◽

Conventional Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽