Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations
Christoph Hofer
◽
Viera Skákalová
◽
Jonas Haas
◽
Xiao Wang
◽
Kai Braun
◽
...
2017 ◽
Vol 11
(12)
◽
pp. 12742-12752
◽
Maxim Ziatdinov
◽
Ondrej Dyck
◽
Artem Maksov
◽
Xufan Li
◽
Xiahan Sang
◽
...
Marcos Alania
◽
Annick De Backer
◽
Ivan Lobato
◽
Florian F. Krause
◽
Dirk Van Dyck
◽
...
2013 ◽
Vol 62
(12)
◽
pp. 3231-3242
◽
Jan S. Erkelens
◽
Arturo Tejada
◽
Arnold J. den Dekker
2008 ◽
Vol 112
(6)
◽
pp. 1759-1763
◽
Norihiko L. Okamoto
◽
Bryan W. Reed
◽
Shareghe Mehraeen
◽
Apoorva Kulkarni
◽
David Gene Morgan
◽
...
2020 ◽
Vol 55
(19)
◽
pp. 8123-8133
◽
Syota Fujinaka
◽
Yukio Sato
◽
Ryo Teranishi
◽
Kenji Kaneko
2008 ◽
Vol 93
(15)
◽
pp. 153107
◽
J. Pizarro
◽
P. L. Galindo
◽
E. Guerrero
◽
A. Yáñez
◽
M. P. Guerrero
◽
...
2003 ◽
Vol 41
(4)
◽
pp. 319-326
◽
Brian P. Kirkmeyer
◽
Richard C. Puetter
◽
Amos Yahil
◽
Karen I. Winey
Andrew B. Yankovich
◽
Benjamin Berkels
◽
W. Dahmen
◽
P. Binev
◽
S. I. Sanchez
◽
...
2017 ◽
Vol 181
◽
pp. 134-143
◽
M. Alania
◽
A. De Backer
◽
I. Lobato
◽
F.F. Krause
◽
D. Van Dyck
◽
...
James M. LeBeau
◽
Adrian J. D’Alfonso
◽
Scott D. Findlay
◽
Susanne Stemmer
◽
Leslie J. Allen
