Valid test pattern identification for VLSI adaptive test

Integration ◽

10.1016/j.vlsi.2021.08.009 ◽

2022 ◽

Vol 82 ◽

pp. 1-6

Author(s):

Tai Song ◽

Tianming Ni ◽

Zhengfeng Huang ◽

JinLei Wan

Keyword(s):

Test Pattern ◽

Pattern Identification ◽

Adaptive Test ◽

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Valid Test Pattern Identification for VLSI Adaptive Test

2021 China Semiconductor Technology International Conference (CSTIC) ◽

10.1109/cstic52283.2021.9461537 ◽

2021 ◽

Author(s):

Tianming Ni ◽

Tai Song

Keyword(s):

Test Pattern ◽

Pattern Identification ◽

Adaptive Test ◽

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AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2021.3053553 ◽

2021 ◽

Vol 29 (3) ◽

pp. 544-557

Author(s):

Chris Nigh ◽

Alex Orailoglu

Keyword(s):

Test Pattern ◽

Hardware Trojan ◽

Adaptive Test ◽

Hardware Trojan Detection ◽

Trojan Detection

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Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis

2021 IEEE 39th VLSI Test Symposium (VTS) ◽

10.1109/vts50974.2021.9441003 ◽

2021 ◽

Author(s):

Chenlei Fang ◽

Qicheng Huang ◽

R. D. Shawn Blanton

Keyword(s):

Test Pattern ◽

Accurate Diagnosis ◽

Adaptive Test ◽

Memory Efficient

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Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00022 ◽

2020 ◽

Author(s):

Chenlei Fang ◽

Qicheng Huang ◽

R.D. Blanton

Keyword(s):

Test Pattern ◽

Nearest Neighbors ◽

K Nearest Neighbors ◽

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A test pattern identification algorithm and its application to CINRAD/SA(B) data

Advances in Atmospheric Sciences ◽

10.1007/s00376-013-2315-9 ◽

2014 ◽

Vol 31 (2) ◽

pp. 331-343

Author(s):

Yuan Jiang ◽

Liping Liu

Keyword(s):

Test Pattern ◽

Pattern Identification ◽

Identification Algorithm

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Chip Test Pattern Reordering Method using Adaptive Test to Reduce Cost for Testing of ICs

IEICE Electronics Express ◽

10.1587/elex.17.20200420 ◽

2020 ◽

Author(s):

Tai Song ◽

Huaguo Liang ◽

Zhengfeng Huang ◽

Tianming Ni ◽

Ying Sun

Keyword(s):

Test Pattern ◽

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The selection of local features for pattern identification: An exploratory study.

PsycEXTRA Dataset ◽

10.1037/e415162004-001 ◽

1970 ◽

Author(s):

D. W. Hastings ◽

S. H. Evans

Keyword(s):

Exploratory Study ◽

Local Features ◽

Pattern Identification ◽

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Correlations of Computer-Adaptive Test Time Measures With Thetas and a Criterion Measure

PsycEXTRA Dataset ◽

10.1037/e572112006-001 ◽

1986 ◽

Author(s):

Mark Y. Czarnolewski ◽

Clessen J. Martin

Keyword(s):

Test Time ◽

Criterion Measure ◽

Computer Adaptive Test ◽

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Supplemental Material for Efficiently Measuring Dimensions of the Externalizing Spectrum Model: Development of the Externalizing Spectrum Inventory-Computerized Adaptive Test (ESI-CAT)

Psychological Assessment ◽

10.1037/pas0000384.supp ◽

2016 ◽

Keyword(s):

Model Development ◽

Computerized Adaptive Test ◽

Adaptive Test ◽

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Penn Reading Assessment Computerized Adaptive Test

PsycTESTS Dataset ◽

10.1037/t72729-000 ◽

2019 ◽

Author(s):

Mikhal A. Yudien ◽

Tyler M. Moore ◽

Allison M. Port ◽

Kosha Ruparel ◽

Raquel E. Gur ◽

...

Keyword(s):

Reading Assessment ◽

Computerized Adaptive Test ◽

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