Correlations of Computer-Adaptive Test Time Measures With Thetas and a Criterion Measure

1986 ◽  
Author(s):  
Mark Y. Czarnolewski ◽  
Clessen J. Martin
Electronics ◽  
2021 ◽  
Vol 10 (6) ◽  
pp. 680
Author(s):  
Huaguo Liang ◽  
Jinlei Wan ◽  
Tai Song ◽  
Wangchao Hou

With the growing complexity of integrated circuits (ICs), more and more test items are required in testing. However, the large number of invalid items (which narrowly pass the test) continues to increase the test time and, consequently, test costs. Aiming to address the problems of long test time and reduced test item efficiency, this paper presents a method which combines a fast correlation-based filter (FCBF) and a weighted naive Bayesian model which can identify the most effective items and make accurate quality predictions. Experimental results demonstrate that the proposed method reduces test time by around 2.59% and leads to fewer test escapes compared with the recently adopted test methods. The study shows that the proposed method can effectively reduce the test cost without jeopardizing test quality excessively.


2010 ◽  
Vol 8 (1) ◽  
pp. 147 ◽  
Author(s):  
Pablo Rebollo ◽  
Ignacio Castejon ◽  
Jesus Cuervo ◽  
Guillermo Villa ◽  
Eduardo Garcia-Cueto ◽  
...  

2011 ◽  
Vol 21 (5) ◽  
pp. 863-872 ◽  
Author(s):  
Stephanie Nikolaus ◽  
Christina Bode ◽  
Erik Taal ◽  
Mart A. F. J. vd Laar

Diabetes ◽  
2021 ◽  
Vol 70 (Supplement 1) ◽  
pp. 830-P
Author(s):  
SUZANNE MITCHELL ◽  
MICHAEL A. KALLEN ◽  
ALEXA BRAGG ◽  
IOANA MOLDOVAN ◽  
JESSICA M. HOWARD ◽  
...  

2019 ◽  
Vol 107 ◽  
pp. 133-141 ◽  
Author(s):  
G. Liegl ◽  
M.A. Petersen ◽  
M. Groenvold ◽  
N.K. Aaronson ◽  
A. Costantini ◽  
...  

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