Skew detection and text line position determination in digitized documents

1997 ◽  
Vol 30 (9) ◽  
pp. 1505-1519 ◽  
Author(s):  
B. Gatos ◽  
N. Papamarkos ◽  
C. Chamzas
Author(s):  
Joost van Beusekom ◽  
Faisal Shafait ◽  
Thomas M. Breuel
Keyword(s):  

Author(s):  
M. Ramanan

Skew detection and correction of a scanned document is a very important step in Optical Character Recognition because skew of scanned document is reducing the accuracy of text line approach for skew detection and correction to calculate the skew angle on multi-script scanned document using Radon transform, Hough transform, Harries corner, Wiener filter and smearing algorithm. In this paper, a proposed approach is compared existing skew detection and correction techniques for printed documents having different scripts: English, Tamil, Sinhala and mixed-script. A proposed hybrid method is tested on 160 documents. The overall testing results is 90.62% for skew detection and correction.


2008 ◽  
Vol 08 (01) ◽  
pp. 47-59
Author(s):  
A. V. N. MANJUNATH ◽  
K. G. HEMANTHA ◽  
S. NOUSHATH

In this paper, we propose a novel skew estimation technique for binary document images based on Boundary Growing Method (BGM), thinning and moments. BGM helps in extracting the text line blocks from the document. Thinning1 is performed to fit the best line for extracted text line blocks. Further, skew is computed for thinned line using second order moments. Several experiments have been conducted on various types of documents such as documents containing south Indian languages, English documents, journals, text with picture, noisy images, and document with different fonts and resolutions, to reveal the robustness of the proposed method. Based on the experimental results we have realized that the proposed method outperforms existing methods both in terms of mean and standard deviation.


Author(s):  
J. M. Zuo ◽  
A. L. Weickenmeier ◽  
R. Holmestad ◽  
J. C. H. Spence

The application of high order reflections in a weak diffraction condition off the zone axis center, including those in high order laue zones (HOLZ), holds great promise for structure determination using convergent beam electron diffraction (CBED). It is believed that in this case the intensities of high order reflections are kinematic or two-beam like. Hence, the measured intensity can be related to the structure factor amplitude. Then the standard procedure of structure determination in crystallography may be used for solving unknown structures. The dynamic effect on HOLZ line position and intensity in a strongly diffracting zone axis is well known. In a weak diffraction condition, the HOLZ line position may be approximated by the kinematic position, however, it is not clear whether this is also true for HOLZ intensities. The HOLZ lines, as they appear in CBED patterns, do show strong intensity variations along the line especially near the crossing of two lines, rather than constant intensity along the Bragg condition as predicted by kinematic or two beam theory.


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