Radiation damage of Si photodiodes by high-temperature irradiation

2003 ◽  
Vol 66 (1-4) ◽  
pp. 536-541 ◽  
Author(s):  
H Ohyama ◽  
K Takakura ◽  
K Shigaki ◽  
S Kuboyama ◽  
S Matsuda ◽  
...  
Crystals ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1350
Author(s):  
Dmitriy I. Shlimas ◽  
Artem L. Kozlovskiy ◽  
Askar Kh. Syzdykov ◽  
Daryn B. Borgekov ◽  
Maxim V. Zdorovets

The aim of this work was to study resistance to helium accumulation processes in the structure of the surface layer of lithium-containing ceramics and the subsequent destruction and embrittlement processes, depending on radiation fluence. The objects of study were Li2TiO3-type ceramics obtained by thermal sintering. The fluence dependency of changes in the structural and strength properties of ceramics was determined to be in the range from 1018 to 1022 ion/m2, which corresponded to the concentration of implanted helium from 0.01% to 0.8–1 at.%. Irradiation was carried out at a temperature of 700 °C, which made it possible to simulate the processes of radiation damage that were closest to the real conditions in the reactor core. During the studies carried out, it was found that, at irradiation fluences of 1018–1020 ion/m2, the formation of point radiation defects was equaled by the process of thermal annealing of defects, as a result of which the concentration of defects and their effect on the change in the structural and strength properties of ceramics were insignificant. An increase in the concentration of implanted helium in the structure of the surface layer to above 0.5 at.% led to the dominance of radiation damage processes over the annealing of defects and the formation of gas-filled cavities, which negatively affects the strength of ceramics.


1971 ◽  
Vol 30 (5) ◽  
pp. 538-542 ◽  
Author(s):  
Z. I. Chechetkina ◽  
V. P. Gol'tsev ◽  
V. A. Kazakov ◽  
G. A. Sernyaev ◽  
V. G. Bazyukin

2003 ◽  
Vol 16 (3-4) ◽  
pp. 533-538 ◽  
Author(s):  
H. Ohyama ◽  
E. Simoen ◽  
C. Claeys ◽  
K. Takakura ◽  
H. Matsuoka ◽  
...  

2018 ◽  
Vol 148 ◽  
pp. 1-4 ◽  
Author(s):  
Gowtham Sriram Jawaharram ◽  
Patrick M. Price ◽  
Christopher M. Barr ◽  
Khalid Hattar ◽  
Robert S. Averback ◽  
...  

Author(s):  
M.L David ◽  
A Ratchenkova ◽  
E Oliviero ◽  
M.F Denanot ◽  
M.F Beaufort ◽  
...  

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