Erratum to: “Damage profiles in as-implanted 〈100〉 Si crystals: strain by X-ray diffractometry versus interstitials by RBS-channeling” [Nucl. Instr. and Meth. B 120 (1996) 64–67]

Author(s):  
R. Nipoti ◽  
M. Servidori ◽  
M. Bianconi ◽  
S. Milita
Keyword(s):  
X Ray ◽  
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