Characterisation of a steel surface after XeCl laser irradiation

2003 ◽  
Vol 208-209 ◽  
pp. 417-423 ◽  
Author(s):  
A. Pereira ◽  
A. Cros ◽  
P. Delaporte ◽  
W. Marine ◽  
M. Sentis
2020 ◽  
Vol 31 (17) ◽  
pp. 175301
Author(s):  
Md Abu Taher ◽  
Sajin Ponnan ◽  
Hiteswar Prasad ◽  
Desai Narayana Rao ◽  
Sri Ram G Naraharisetty

2014 ◽  
Vol 47 (5) ◽  
pp. 1101-1107 ◽  
Author(s):  
S. Panahibakhsh ◽  
S. Jelvani ◽  
M. H. Maleki ◽  
M. Mollabashi ◽  
M. Jaberi

2014 ◽  
Vol 60 ◽  
pp. 12-17 ◽  
Author(s):  
S. Panahibakhsh ◽  
S. Jelvani ◽  
M.H. Maleki ◽  
M. Mollabashi ◽  
S. Abolhosseini

2007 ◽  
Vol 22 (5) ◽  
pp. 1270-1274
Author(s):  
Hirokazu Masai ◽  
Shintaro Mizuno ◽  
Takumi Fujiwara ◽  
Yasuhiko Benino ◽  
Takayuki Komatsu ◽  
...  

Creation of mirror dots, localized areas of smooth surface with a shape of laser beam on a glass material, using a XeCl laser irradiation is reported. Laser irradiation of a 40BaO–40TiO2–20B2O3 sample heated to 300 °C induced a smooth and flat surface, where no scratches caused by a mechanical polishing were observed. The present finding indicates that the melting of the surface occurred by the combined effect of the heat-assistance and the increased absorption coefficient of TiO2. In the present system, the absorption coefficient in the ultraviolet region, which originates from TiO2, was found to increase with increasing temperature. The presented technique will open new possibilities in integrated optics; the surface of a small protruded or hollow area can be made smooth, which cannot be achieved by conventional mechanical polishing.


2002 ◽  
Vol 197-198 ◽  
pp. 845-850 ◽  
Author(s):  
A Pereira ◽  
A Cros ◽  
Ph Delaporte ◽  
W Marine ◽  
M Sentis

2019 ◽  
Vol 2019.27 (0) ◽  
pp. 414
Author(s):  
Yuji USHITSUKA ◽  
Makoto TESHIGAWARA ◽  
Takashi NAOE ◽  
Kazuhiko YAMASAKI ◽  
Nobuatsu TANAKA ◽  
...  

2004 ◽  
Vol 830 ◽  
Author(s):  
W. X. Xianyu ◽  
H. S. Cho ◽  
J. Y. Kwon ◽  
H.X. Yin ◽  
T. Noguchi

ABSTRACTIn this study, we successfully produced PbZr0.4Ti0.6O3 (PZT (40/60)) thin films with high crystallinity and high remnant polarization (Pr) at low process temperatures using pulsed excimer (XeCl) laser irradiation. In our experiments, amorphous PZT films were prepared on Pt/Ti/SiO2/Si substrates by a sol-gel method. A two-step process was used to crystallize the amorphous thin films: the films were annealed at 550°C for 10 min to initiate the nucleation of the PZT perovskite phase, and then annealed with an excimer laser heating at 400°C in a 120 Torr nitrogen gas atmosphere. Laser energy density was varied from 150 to 750 mJ/cm2 per pulse. x-ray diffraction (XRD) patterns show that 150–200 mJ/cm2 range multi-shot excimer laser irradiation drastically improved the crystallinity of the PZT perovskite phase, and FESEM photographs show that the PZT thin film has uniform-sized crystal grains. The ferroelectric properties were found to depend on the laser energy density and shot number. Before the laser annealing, the films show hysteresis loops with low Pr and the loops do not saturate. After laser annealing, the films show highly saturated hysteresis loops, with the Pr increasing from 2.2 μC/cm2 to 23.0 μC/cm2. We also propose a new technology for fabrication of thin film transistor (TFT)-driven FeRAM devices on arbitrary insulator substrate such as on glass.


Sign in / Sign up

Export Citation Format

Share Document