Double-exposure holographic interferometry technique used for characterization of electrodeposited cobalt oxide thin films
2002 ◽
Vol 74
(2)
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pp. 143-149
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1997 ◽
Vol 101
(1)
◽
pp. 281-288
2018 ◽
Vol 23
(5)
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pp. 253-259
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2011 ◽
Vol 509
(37)
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pp. 9183-9189
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Keyword(s):
2017 ◽
2001 ◽
Vol 36
(1-2)
◽
pp. 161-170
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Keyword(s):
Studies on electrodeposited silver sulphide thin films by double exposure holographic interferometry
2008 ◽
Vol 255
(5)
◽
pp. 1819-1823
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