scholarly journals DETERMINATION OF INTRINSIC STRESS DUE TO LEAD SELENIDE THIN FILMS USING DOUBLE EXPOSURE HOLOGRAPHIC INTERFEROMETRY

Author(s):  
Mane R.D.Chikode P.P. and Dongare M.B. Mane R.D.Chikode P.P. and Dongare M.B. ◽  
2009 ◽  
Vol 255 (20) ◽  
pp. 8688-8694 ◽  
Author(s):  
N.S. Shinde ◽  
V.B. Prabhune ◽  
H.D. Dhaigude ◽  
C.D. Lokhande ◽  
V.J. Fulari

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