A comparison of the performance of a fundamental parameter method for analysis of total reflection X-ray fluorescence spectra and determination of trace elements, versus an empirical quantification procedure

1998 ◽  
Vol 53 (1) ◽  
pp. 43-48 ◽  
Author(s):  
Dariusz W(egrzynek ◽  
Barbara Hołyńska ◽  
Beata Ostachowicz
Keyword(s):  
Trace Elements ◽  
Fluorescence Spectra ◽  
Total Reflection ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Fundamental Parameter Method

Quantitative Trace Analysis by X-ray Fluorescence Using the Computer Program NRLXRF

1982 ◽  
Vol 36 (1) ◽  
pp. 19-22 ◽  
Author(s):  
J. A. Keenan ◽  
D. Holmes
Keyword(s):  
Aluminum Alloys ◽  
Computer Program ◽  
Standard Reference Materials ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
National Bureau ◽  
X Ray ◽  
Trace Constituents ◽  
Fundamental Parameter Method

The computer program NRLXRF has been applied to the determination of minor and trace constituents in aluminum alloys and several National Bureau of Standards certified standard reference materials. Limitations arising from energy dispersive x-ray analysis and the fundamental-parameter method used by NRLXRF are illustrated.

Determination of trace elements in rainwater by total-reflection x-ray fluorescence

1985 ◽  
Vol 57 (14) ◽  
pp. 2880-2885 ◽  
Author(s):  
Rolf Peter. Stoessel ◽  
Andreas. Prange
Keyword(s):  
Trace Elements ◽  
Total Reflection ◽  
X Ray ◽  
Elements In Rainwater

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

2005 ◽  
Vol 20 (2) ◽  
pp. 183-183
Author(s):  
Y. Kataoka ◽  
N. Kawahara ◽  
S. Hara ◽  
Y. Yamada ◽  
T. Matsuo ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray ◽  
Fundamental Parameter Method
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