Quantitative Trace Analysis by X-ray Fluorescence Using the Computer Program NRLXRF

1982 ◽  
Vol 36 (1) ◽  
pp. 19-22 ◽  
Author(s):  
J. A. Keenan ◽  
D. Holmes
Keyword(s):  
Aluminum Alloys ◽  
Computer Program ◽  
Standard Reference Materials ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
National Bureau ◽  
X Ray ◽  
Trace Constituents ◽  
Fundamental Parameter Method

The computer program NRLXRF has been applied to the determination of minor and trace constituents in aluminum alloys and several National Bureau of Standards certified standard reference materials. Limitations arising from energy dispersive x-ray analysis and the fundamental-parameter method used by NRLXRF are illustrated.

Use of a Calculation Method for X-Ray Emission Analysis

1969 ◽  
Vol 23 (4) ◽  
pp. 346-348 ◽  
Author(s):  
A. Batt
Keyword(s):  
Computer Program ◽  
Calculation Method ◽  
Applied Research ◽  
Spectrochemical Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
Emission Analysis ◽  
Basic Approach ◽  
X Ray ◽  
Fundamental Parameter Method

The use of a fundamental parameter method for effecting matrix corrections in quantitative x-ray spectrochemical analysis is described. A versatile computer program calculates composition directly from measured intensities. Variations in the basic approach are employed in the analysis of a series of sulfide and oxide samples. The Applied Research Laboratories multi-channel x-ray quantometer (MXQ) is briefly described.

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

2005 ◽  
Vol 20 (2) ◽  
pp. 183-183
Author(s):  
Y. Kataoka ◽  
N. Kawahara ◽  
S. Hara ◽  
Y. Yamada ◽  
T. Matsuo ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray ◽  
Fundamental Parameter Method

Application of Multi-Layer Thin Film Analysis by X-ray Spectrometry Using the Fundamental Parameter Method

1989 ◽  
Vol 33 ◽  
pp. 225-235
Author(s):  
Y. Kataoka ◽  
T. Arai
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Thin Film Analysis ◽  
Precise Analysis ◽  
Minimum Number ◽  
Layer Thin Film ◽  
Fundamental Parameter Method

The fundamental parameter method for x-ray spectrometry has been used most commonly for bulk samples, because it permits an analysis utilizing a minimum number of standards, even for samples with complicated matrices. The need for the analysis of thin film materials, which includes multi-layer films, has been increasing in recent years along with the rapid progress of high technologies. However, there have been few reports that deal with the application of fundamental parameter methods to multi-layer thin films. There may be two situations in the analysis of thin films. In routine analysis of quality control applications, they usually require precise analysis. Fortunately, it is possible to prepare well characterized standards similar to the unknowns.

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