Selective area growth and epitaxial lateral overgrowth of GaN by metalorganic vapor phase epitaxy and hydride vapor phase epitaxy

1999 ◽  
Vol 59 (1-3) ◽  
pp. 104-111 ◽  
Author(s):  
Kazumasa Hiramatsu ◽  
Hidetada Matsushima ◽  
Takumi Shibata ◽  
Yasutoshi Kawagachi ◽  
Nobuhiko Sawaki
1998 ◽  
Vol 537 ◽  
Author(s):  
Yasutoshi Kawaguchi ◽  
Shingo Nambu ◽  
Hiroki Sone ◽  
Masahito Yamaguchi ◽  
Hideto Miyake ◽  
...  

AbstractSelective area growth (SAG) and epitaxial lateral overgrowth (ELO) of GaN using tungsten (W) mask by metalorganic vapor phase epitaxy (MOVPE) and hydride vapor phase epitaxy (HVPE) have been studied. The selectivity of the GaN growth on the W mask as well as the SiO2 mask is excellent for both MOVPE and HVPE. The ELO-GaN layers are successfully obtained by HVPE on the stripe patterns along the <1100> crystal axis with the W mask as well as the SiO2 mask. There are no voids between the SiO2 mask and the overgrown GaN layer, while there are triangular voids between the W mask and the overgrown layer. The surface of the ELO-GaN layer is quite uniform for both mask materials. In the case of MOVPE, the structures of ELO layers on the W mask are the same as those on the SiO2 mask for the <1120> and <1100> stripe patterns. No voids are observed between the W or SiO2 mask and the overgrown GaN layer by using MOVPE.


1999 ◽  
Vol 4 (S1) ◽  
pp. 441-446 ◽  
Author(s):  
Yasutoshi Kawaguchi ◽  
Shingo Nambu ◽  
Hiroki Sone ◽  
Masahito Yamaguchi ◽  
Hideto Miyake ◽  
...  

Selective area growth (SAG) and epitaxial lateral overgrowth (ELO) of GaN using tungsten (W) mask by metalorganic vapor phase epitaxy (MOVPE) and hydride vapor phase epitaxy (HVPE) have been studied. The selectivity of the GaN growth on the W mask as well as the SiO2 mask is excellent for both MOVPE and HVPE. The ELO-GaN layers are successfully obtained by HVPE on the stripe patterns along the <1 00> crystal axis with the W mask as well as the SiO2 mask. There are no voids between the SiO2 mask and the overgrown GaN layer, while there are triangular voids between the W mask and the overgrown layer. The surface of the ELO-GaN layer is quite uniform for both mask materials. In the case of MOVPE, the structures of ELO layers on the W mask are the same as those on the SiO2 mask for the <11 0> and <1 00> stripe patterns. No voids are observed between the W or SiO2 mask and the overgrown GaN layer by using MOVPE.


Author(s):  
Gabin Grégoire ◽  
Mohammed Zeghouane ◽  
Curtis Goosney ◽  
Nebile Isik Goktas ◽  
Philipp Staudinger ◽  
...  

2020 ◽  
Vol 20 (4) ◽  
pp. 2232-2239 ◽  
Author(s):  
Mohammed Zeghouane ◽  
Geoffrey Avit ◽  
Yamina André ◽  
Thierry Taliercio ◽  
Pierre Ferret ◽  
...  

2020 ◽  
pp. 2000447
Author(s):  
Axel Strömberg ◽  
Prakhar Bhargava ◽  
Zhehan Xu ◽  
Sebastian Lourdudoss ◽  
Yan-Ting Sun

2003 ◽  
Vol 252 (1-3) ◽  
pp. 9-13 ◽  
Author(s):  
X.M. Shen ◽  
G. Feng ◽  
B.S. Zhang ◽  
L.H. Duan ◽  
Y.T. Wang ◽  
...  

1998 ◽  
Vol 37 (Part 2, No. 7B) ◽  
pp. L845-L848 ◽  
Author(s):  
Yasutoshi Kawaguchi ◽  
Shingo Nambu ◽  
Hiroki Sone ◽  
Takumi Shibata ◽  
Hidetada Matsushima ◽  
...  

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