Selective Area Growth by Hydride Vapor Phase Epitaxy and Optical Properties of InAs Nanowire Arrays

Author(s):  
Gabin Grégoire ◽  
Mohammed Zeghouane ◽  
Curtis Goosney ◽  
Nebile Isik Goktas ◽  
Philipp Staudinger ◽  
...  
2020 ◽  
Vol 20 (4) ◽  
pp. 2232-2239 ◽  
Author(s):  
Mohammed Zeghouane ◽  
Geoffrey Avit ◽  
Yamina André ◽  
Thierry Taliercio ◽  
Pierre Ferret ◽  
...  

1999 ◽  
Vol 4 (S1) ◽  
pp. 441-446 ◽  
Author(s):  
Yasutoshi Kawaguchi ◽  
Shingo Nambu ◽  
Hiroki Sone ◽  
Masahito Yamaguchi ◽  
Hideto Miyake ◽  
...  

Selective area growth (SAG) and epitaxial lateral overgrowth (ELO) of GaN using tungsten (W) mask by metalorganic vapor phase epitaxy (MOVPE) and hydride vapor phase epitaxy (HVPE) have been studied. The selectivity of the GaN growth on the W mask as well as the SiO2 mask is excellent for both MOVPE and HVPE. The ELO-GaN layers are successfully obtained by HVPE on the stripe patterns along the <1 00> crystal axis with the W mask as well as the SiO2 mask. There are no voids between the SiO2 mask and the overgrown GaN layer, while there are triangular voids between the W mask and the overgrown layer. The surface of the ELO-GaN layer is quite uniform for both mask materials. In the case of MOVPE, the structures of ELO layers on the W mask are the same as those on the SiO2 mask for the <11 0> and <1 00> stripe patterns. No voids are observed between the W or SiO2 mask and the overgrown GaN layer by using MOVPE.


2020 ◽  
pp. 2000447
Author(s):  
Axel Strömberg ◽  
Prakhar Bhargava ◽  
Zhehan Xu ◽  
Sebastian Lourdudoss ◽  
Yan-Ting Sun

1998 ◽  
Vol 537 ◽  
Author(s):  
Yasutoshi Kawaguchi ◽  
Shingo Nambu ◽  
Hiroki Sone ◽  
Masahito Yamaguchi ◽  
Hideto Miyake ◽  
...  

AbstractSelective area growth (SAG) and epitaxial lateral overgrowth (ELO) of GaN using tungsten (W) mask by metalorganic vapor phase epitaxy (MOVPE) and hydride vapor phase epitaxy (HVPE) have been studied. The selectivity of the GaN growth on the W mask as well as the SiO2 mask is excellent for both MOVPE and HVPE. The ELO-GaN layers are successfully obtained by HVPE on the stripe patterns along the <1100> crystal axis with the W mask as well as the SiO2 mask. There are no voids between the SiO2 mask and the overgrown GaN layer, while there are triangular voids between the W mask and the overgrown layer. The surface of the ELO-GaN layer is quite uniform for both mask materials. In the case of MOVPE, the structures of ELO layers on the W mask are the same as those on the SiO2 mask for the <1120> and <1100> stripe patterns. No voids are observed between the W or SiO2 mask and the overgrown GaN layer by using MOVPE.


2017 ◽  
Vol 57 (1S) ◽  
pp. 01AD03 ◽  
Author(s):  
Sung Geun Bae ◽  
Injun Jeon ◽  
Hunsoo Jeon ◽  
Kyoung Hwa Kim ◽  
Min Yang ◽  
...  

2016 ◽  
Vol 55 (5S) ◽  
pp. 05FF03 ◽  
Author(s):  
Kaddour Lekhal ◽  
Si-Young Bae ◽  
Ho-Jun Lee ◽  
Tadashi Mitsunari ◽  
Akira Tamura ◽  
...  

CrystEngComm ◽  
2019 ◽  
Vol 21 (16) ◽  
pp. 2702-2708 ◽  
Author(s):  
Mohammed Zeghouane ◽  
Geoffrey Avit ◽  
Thomas W. Cornelius ◽  
Damien Salomon ◽  
Yamina André ◽  
...  

Well-ordered and vertically aligned InN nanorods with high aspect ratios are synthesized by hydride vapor phase epitaxy (HVPE) using the selective area growth (SAG) approach.


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