Layer stackings and physical properties of mixed-layer structure phases III: preparation of mixed-layer structure phases of ReXNb1−XSe2 and OsXNb1−XSe2 and some electrical and magnetic properties

The multilayers of ferroelectric (FE) Pb(Zr, Ti)O3 (PZT) and ferromagnetic (FM) CoFe2O4 (CFO) thin films with 3, 5, and 9 layers having configurations PZT/CFO (PC) and CFO/PZT (CP) were fabricated by pulsed laser deposition technique. We have investigated the effect of inter-diffusion at the interface of multilayers (MLs) and reversing the order of FE and FM layers in the multilayers configuration on the electrical/magnetic properties. The TEM of the films showed that the layer structure was not maintained and the inter-diffusion of the CFO into PZT and vice verse were observed at the interface of MLs. Both the PC and CP configurations of multilayer films exhibited pseudo FE hysteresis loop and proper FM hysteresis loops at room temperature. Reversing the multilayer configuration from CP to PC resulted in increasing the pseudo remanent polarization, however this behavior was not observed in magnetic properties. The frequency and temperature dependences of the impedance and modulus spectroscopy of the multilayer PC and CP films were studied in the ranges of 102 to 106 Hz and 200 to 650 K respectively. The electrical response of all multilayer films investigated could be resolved into two contributions. We attributed these to the grain and grain boundary effects in impedance and modulus formalism. We found that the difference between the grain and grain boundary capacitive effect decreased due to increase of the number of layers.

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AEM analysis of crystallization in Ti-based amorphous alloys

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075142 ◽

1983 ◽

Vol 41 ◽

pp. 270-271

Author(s):

A.R. Pelton ◽

A.F. Marshall ◽

Y.S. Lee

Keyword(s):

Magnetic Properties ◽

Amorphous Alloys ◽

Amorphous Materials ◽

Isothermal Annealing ◽

Amorphous Matrix ◽

Nucleation And Growth ◽

Current Interest ◽

Amorphous Films ◽

Electrical And Magnetic Properties

Amorphous materials are of current interest due to their desirable mechanical, electrical and magnetic properties. Furthermore, crystallizing amorphous alloys provides an avenue for discerning sequential and competitive phases thus allowing access to otherwise inaccessible crystalline structures. Previous studies have shown the benefits of using AEM to determine crystal structures and compositions of partially crystallized alloys. The present paper will discuss the AEM characterization of crystallized Cu-Ti and Ni-Ti amorphous films.Cu60Ti40: The amorphous alloy Cu60Ti40, when continuously heated, forms a simple intermediate, macrocrystalline phase which then transforms to the ordered, equilibrium Cu3Ti2 phase. However, contrary to what one would expect from kinetic considerations, isothermal annealing below the isochronal crystallization temperature results in direct nucleation and growth of Cu3Ti2 from the amorphous matrix.

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Investigation of the Electrical and Magnetic Properties of Chromium Single Crystals

Uspekhi Fizicheskih Nauk ◽

10.3367/ufnr.0107.197206k.0330 ◽

1972 ◽

Vol 107 (6) ◽

pp. 330

Author(s):

E.I. Kondorskii ◽

T.I. Kostina ◽

L.N. Ékonomova

Keyword(s):

Magnetic Properties ◽

Single Crystals ◽

Electrical And Magnetic Properties

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ARMCO DI-MAX NONORIENTED ELECTRICAL STEELS

Alloy Digest ◽

10.31399/asm.ad.fe0088 ◽

1999 ◽

Vol 48 (1) ◽

Keyword(s):

Magnetic Properties ◽

Physical Properties ◽

Tensile Properties ◽

Core Loss ◽

Electrical Steels

Abstract Armco DI-MAX nonoriented electrical steels have practically identical magnetic properties in any direction of magnetism in the plane of the material. They have superior permeability at high inductions, low average core loss, good gage uniformity, excellent flatness, and a high stacking factor. This datasheet provides information on composition, physical properties, hardness, and tensile properties. Filing Code: FE-88. Producer or source: Armco Inc., Specialty Steels Division. Originally published April 1989, revised January 1999.

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