Mechanism of improvement of resistance degradation in Y-doped BaTiO3 based MLCCs with Ni electrodes under highly accelerated life testing

1999 ◽  
Vol 19 (6-7) ◽  
pp. 1061-1065 ◽  
Author(s):  
Shigeki Sato ◽  
Yukie Nakano ◽  
Akira Sato ◽  
Takeshi Nomura
Author(s):  
Vanderley Vasconcelos ◽  
WELLINGTON SOARES ◽  
Antonio Carlos Lopes da Costa ◽  
Raíssa Oliveira Marques

Author(s):  
Abd El-Maseh, M. P

<p>In this paper, the Bayesian estimation for the unknown parameters for the bivariate generalized exponential (BVGE) distribution under Bivariate censoring type-I samples with constant stress accelerated life testing (CSALT) are discussed. The scale parameter of the lifetime distribution at constant stress levels is assumed to be an inverse power law function of the stress level. The parameters are estimated by Bayesian approach using Markov Chain Monte Carlo (MCMC) method based on Gibbs sampling. Then, the numerical studies are introduced to illustrate the approach study using samples which have been generated from the BVGE distribution.</p>


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