Erratum to “High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co–Al–O alloys” [Scripta Materialia 48 (2003) 909–914]

2003 ◽  
Vol 49 (1) ◽  
pp. 109
Author(s):  
N Tanaka ◽  
J Yamasaki ◽  
S Mitani ◽  
K Takanashi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
High Angle ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
Electron Energy Loss

Atomic Ordering and Disordering of Amorphous CoNiP Alloy

2018 ◽  
Vol 386 ◽  
pp. 377-382
Author(s):  
Evgenii V. Pustovalov ◽  
Alexander F. Fedorets ◽  
Vladimir V. Tkachev ◽  
Vladimir S. Plotnikov
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
Electron Energy Loss ◽  
Temperature Heating ◽  
Thermal Stability Of

The structure of electrolytically deposited nanocrystalline alloys of the CoP-CoNiP systems under low-temperature heating was investigated by means of high-resolution transmission electron microscopy (HRTEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM), and analytical methods such as energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). Structural relaxation and crystallization were investigated at temperatures from 150°C to 300°C. Structural and compositional inhomogeneities were found in the CoP-CoNiP alloys, while the local changes in composition were found to reach 15 at.%. Nanocrystals in the alloys grew most intensely in the presence of a free surface. It was determined that the local diffusion coefficient ranged from 1.2 to 2.4 10−18 m2/s, which could be explained by the surface diffusion prevalence. The data gathered in these investigations can be further used to predict the thermal stability of CoP-CoNiP alloys.

High-Angle Annular Dark Field Scanning Transmission Electron Microscopy on Carbon-Based Functional Polymer Systems

2009 ◽  
Vol 15 (3) ◽  
pp. 251-258 ◽  
Author(s):  
Erwan Sourty ◽  
Svetlana van Bavel ◽  
Kangbo Lu ◽  
Ralph Guerra ◽  
Georg Bar ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
High Angle ◽  
Functional Polymer ◽  
Polymer Systems ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field

AbstractTwo purely carbon-based functional polymer systems were investigated by bright-field conventional transmission electron microscopy (CTEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). For a carbon black (CB) filled polymer system, HAADF-STEM provides high contrast between the CB agglomerates and the polymer matrix so that details of the interface organization easily can be revealed and assignment of the CB phase is straightforward. For a second system, the functional polymer blend representing the photoactive layer of a polymer solar cell, details of its nanoscale organization could be observed that were not accessible with CTEM. By varying the camera length in HAADF-STEM imaging, the contrast can be enhanced between crystalline and amorphous compounds due to diffraction contrast so that nanoscale interconnections between domains are identified. In general, due to its incoherent imaging characteristics HAADF-STEM allows for reliable interpretation of the data obtained.

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