AbstractThe descriptive scattering parameters, haze and angular distribution functions of textured ZnO:Al transparent conductive oxides with different surface roughness are measured. An approach to determine the scattering parameters of all internal interfaces in p-i-n a-Si:H solar cells deposited on the glass/ZnO:Al substrates is presented. Using the determined scattering parameters as the input parameters of the optical model, a good agreement between the measured and simulated quantum efficiencies of the p-i-n a-Si:H solar cells with different interface roughness is achieved.
In this work we propose a method for single image dehazing that exploits a physical model to recover the haze-free image by estimating the atmospheric scattering parameters. Cycle consistency is used to further improve the reconstruction quality of local structures and objects in the
scene as well. Experimental results on four real and synthetic hazy image datasets show the effectiveness of the proposed method in terms of two commonly used full-reference image quality metrics.
A method of minimizing the volume of reliability tests for non-recoverable machines at the stage of their development by increasing the test time and using forced modes is described.
Keywords
tests, degradation failure, reliability, scattering parameters, random variables
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Power waves and scattering parameters in magneto-inductive systems
