Observation of Dynamic Extinction Lines in the (420) Diffraction Disks of the MgAl2O4 Spinel CBED Pattern

1990 ◽  
Vol 48 (2) ◽  
pp. 506-507
Author(s):  
Dangrong R. Liu
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Beam Electron ◽  
Space Group ◽  
Mgal2o4 Spinel ◽  
Principal Axes ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Dynamic Scattering

Many people have observed dynamic extinction lines in the {200} diffraction disks of the <100> zone axis CBED (convergent beam electron diffraction) patterns of the MgAl2O4 spinel. These dark lines are manifestation of the space group of the material and can easily be explained with the Gjønnes-Moodie theory. However, in addition to the extinction lines in the {200} disks, We have also been able to observe dynamic extinction lines present in the {420} diffraction disks in the same CBED pattern.The CBED work in this work was carried out with a JEOL-2000FX microscope operated at 100.15 kV. One <100> zone axis CBED pattern is shown in Fig. 1. The dark lines are clearly shown in the {420} disks running through the two perpendicular non-principal axes, in exactly same way as the dark lines in {200} disks.One can easily explain the dynamic extinction lines in the {200} disks with the Gjønnes-Moodie theory by drawing dynamic scattering pairs oG-Ga and oH-Ha, oK-Ka and oL-La etc. in the diagram (Fig. 2).

A library of convergent-beam electron diffraction patterns

1986 ◽  
Vol 44 ◽  
pp. 688-691
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Diffraction ◽  
Materials Science ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Transmission Electron ◽  
Yield Information ◽  
Analytical Electron ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Electron Energy Loss

One of the most important advancements of the transmission electron microscopy (TEM) in recent years has been the development of the analytical electron microscope (AEM). The microanalytical capabilities of AEMs are based on the three major techniques that have been refined in the last decade or so, namely, Convergent Beam Electron Diffraction (CBED), X-ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS). Each of these techniques can yield information on the specimen under study that is not obtainable by any other means. However, it is when they are used in concert that they are most powerful. The application of CBED in materials science is not restricted to microanalysis. However, this is the area where it is most frequently employed. It is used specifically to the identification of the lattice-type, point and space group of phases present within a sample. The addition of chemical/elemental information from XEDS or EELS spectra to the diffraction data usually allows unique identification of a phase.

Convergent Beam Electron Diffraction Zone Axis Pattern Map of Zirconium

1990 ◽  
Vol 48 (2) ◽  
pp. 496-497
Author(s):  
E. Silva ◽  
R. Scozia
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Pole Piece ◽  
Small Particles ◽  
Present Communication ◽  
Beam Electron ◽  
Zero Layer ◽  
Set Up ◽  
Convergent Beam

The purpose in obtaining zone axis pattern map (zap map) from a given material is to provide a quick and reliable tool to identify cristaline phases, and crystallographic directions, even in small particles. Bend contours patterns and Kossel lines patterns maps from Zr single crystal in the [0001] direction have been presented previously. In the present communication convergent beam electron diffraction (CBED) zap map of Zr will be shown. CBED patterns were obtained using a Philips microscope model EM300, which was set up to carry out this technique. Convergent objective upper pole piece for STEM and some electronic modifications in the lens circuits were required, furthermore the microscope was carefully cleaned and it was operated at a vacuum eminently good.CBED patterns in the Zr zap map consist of zero layer disks, showing fine details within them which correspond to intersecting set of higher order Laue zone (HOLZ) deficiency lines.

Experimental Studies of Bonding Related Properties in Binary Intermetallics by Convergent Beam Electron Diffraction

2011 ◽  
Vol 1295 ◽  
Author(s):  
X. H. Sang ◽  
A. Kulovits ◽  
J. Wiezorek
Keyword(s):  
Electron Diffraction ◽  
Experimental Studies ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Order Structure ◽  
Electron Charge Density ◽  
Beam Electron ◽  
Structure Factors ◽  
Different Temperatures ◽  
Convergent Beam

ABSTRACTAccurate Debye-Waller (DW) factors of chemically ordered β-NiAl (B2, cP2, ${\rm{Pm}}\bar 3 {\rm{m}}$) have been measured at different temperatures using an off-zone axis multi-beam convergent beam electron diffraction (CBED) method. We determined a cross over temperature below which the DW factor of Ni becomes smaller than that of Al of ~90K. Additionally, we measured for the first time DW factors and structure factors of chemically ordered γ1-FePd (L10, tP2, P4/mmm) at 120K. We were able to simultaneously determine all four anisotropic DW factors and several low order structure factors using different special off-zone axis multi-beam convergent beam electron diffraction patterns with high precision and accuracy. An electron charge density deformation map was constructed from measured X-ray diffraction structure factors for γ1-FePd.

Determination of space group of BaPb0.75Bi0.25O3 by convergent-beam electron diffraction

2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Space Group Determination of the Room-Temperature Phase ofα '-NaV2O5Using Convergent-Beam Electron Diffraction

2000 ◽  
Vol 69 (7) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Room Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Temperature Phase ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Identification of the impurity phase in high-purity CeB6 by convergent-beam electron diffraction

2019 ◽  
Vol 75 (3) ◽  
pp. 489-500
Author(s):  
Ding Peng ◽  
Philip N. H. Nakashima
Keyword(s):  
Electron Diffraction ◽  
High Purity ◽  
Density Functional ◽  
Convergent Beam Electron Diffraction ◽  
Impurity Phase ◽  
Lattice Parameters ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam ◽  
Very High

The rare earth hexaborides are known for their tendency towards very high crystal perfection. They can be grown into large single crystals of very high purity by inert gas arc floating zone refinement. The authors have found that single-crystal cerium hexaboride grown in this manner contains a significant number of inclusions of an impurity phase that interrupts the otherwise single crystallinity of this prominent cathode material. An iterative approach is used to unequivocally determine the space group and the lattice parameters of the impurity phase based on geometries of convergent-beam electron diffraction (CBED) patterns and the symmetry elements that they possess in their intensity distributions. It is found that the impurity phase has a tetragonal unit cell with space group P4/mbm and lattice parameters a = b = 7.23 ± 0.03 and c = 4.09 ± 0.02 Å. These agree very well with those of a known material, CeB4. Confirmation that this is indeed the identity of the impurity phase is provided by quantitative CBED (QCBED) where the very close match between experimental and calculated CBED patterns has confirmed the atomic structure. Further confirmation is provided by a density functional theory calculation and also by high-angle annular dark-field scanning transmission electron microscopy.

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