Teoretical Tools for Practical ALCHEMI

2001 ◽  
Vol 7 (S2) ◽  
pp. 348-349
Author(s):  
L. J. Allen ◽  
M. P. Oxley

Precisely known atomic scattering factors are essential for accurate atom location by channelling enhanced microanalysis (ALCHEMI) based on inner-shell ionization.1 For ALCHEMI using energy dispersive x-ray analysis (EDX), first principles calculations of ionization cross sections, realistically modeling the “delocalization” of the ionization interaction, give excellent agreement with experiment.2 Such calculations are complex and computationally intensive. Hence, simple analytic forms are often assumed to describe the ionization potential. However such analytic forms require prior knowledge of the “delocalization” of the effective ionization interaction. Such an approach assumes that the precise shape of the ionization potential is not important but that at least the half width at half maximum (HWHM) should be accurately estimated, for example using estimates of the HWHM from root-mean-square impact parameters for ionization. However this is generally not a good approximation3 and we have provided more realistic estimates (Fig. 1).

1999 ◽  
Vol 5 (S2) ◽  
pp. 584-585
Author(s):  
X. Llovet ◽  
C. Merlet ◽  
J.M. Fernández-Varea ◽  
F. Salvat

Knowledge of inner-shell ionization cross sections by electron impact is needed for quantitative procedures in electron probe microanalysis (EPMA) and Auger electron spectroscopy (AES) The common practice is to use semi-empirical formulas, based on the asymptotic limit of the Bethe theory, which sometimes are used beyond their domain of validity. Experimental measurements of ionization cross sections are scarce and affected by considerable uncertainties, thus a mere comparison with experimental data does not permit to draw a definite conclusion abou the accuracy of the various formulas. In this communication, we present new measurements o the relative variation of K- and L-shell ionization cross sections deduced from the counting rate of characteristic x-rays emitted by extremely thin films of Cr, Ni, Cu, Te, Au and Bi bombardec by keV electrons.The studied films were produced by thermal evaporation on backing self-supported 30 nm carbon films.


2005 ◽  
Vol 37 (3) ◽  
pp. 361-369 ◽  
Author(s):  
M. A. Uddin ◽  
A. K.F. Haque ◽  
K. R. Karim ◽  
A. K. Basak ◽  
F. B. Malik

Author(s):  
Changhuan Tang ◽  
Zhengming Luo ◽  
Zhu An ◽  
Fuqing He ◽  
Xiufeng Peng ◽  
...  

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