Ion Beam Analysis
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Published By Elsevier

9781483228891

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CREATION OF SURFACE DAMAGE ON A NICKEL (110) SURFACE BY BOMBARDMENT WITH 3–30 keV NOBLE GAS IONS

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50097-9 ◽

1980 ◽

pp. 595-599

Author(s):

L.K. VERHEIJ ◽

E. VAN LOENEN ◽

J.A. VAN DEN BERG ◽

D.G. ARMOUR

Keyword(s):

Noble Gas ◽

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ION INDUCED SECONDARY ELECTRON EMISSION AS A PROBE FOR ADSORBED OXYGEN ON TUNGSTEN

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50094-3 ◽

1980 ◽

pp. 579-583

Author(s):

D. HASSELKAMP ◽

A. SCHARMANN ◽

N. STILLER

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Adsorbed Oxygen

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ELEMENTAL MICROANALYSIS OF BIOLOGICAL AND MEDICAL SPECIMENS WITH A SCANNING PROTON MICROPROBE

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50092-x ◽

1980 ◽

pp. 563-569

Author(s):

G.J.F. LEGGE ◽

A.P. MAZZOLINI

Keyword(s):

Proton Microprobe ◽

Elemental Microanalysis ◽

Scanning Proton Microprobe

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HYDROGEN RATIOS AND PROFILES IN DEPOSITED AMORPHOUS AND POLYCRYSTALLINE FILMS AND IN METALS USING NUCLEAR TECHNIQUES

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50089-x ◽

1980 ◽

pp. 547-550

Author(s):

R.E. BENENSON ◽

L.C. FELDMAN ◽

B.G. BAGLEY

Keyword(s):

Polycrystalline Films ◽

Nuclear Techniques

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NUCLEAR REACTION ANALYSIS OF HYDROGEN IN AMORPHOUS SILICON AND SILICON CARBIDE FILMS

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50081-5 ◽

1980 ◽

pp. 499-504

Author(s):

E. LIGEON ◽

J. FONTENILLE ◽

R. DANIELOU ◽

A. GUIVARC'H ◽

M. LE CONTELLEC ◽

...

Keyword(s):

Silicon Carbide ◽

Amorphous Silicon ◽

Nuclear Reaction ◽

Nuclear Reaction Analysis

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APPLICATIONS OF (n, p) AND (n, α) REACTIONS AND A BACKSCATTERING TECHNIQUE TO FUSION REACTOR MATERIALS, ARCHEOMETRY, AND NUCLEAR SPECTROSCOPY

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50074-8 ◽

1980 ◽

pp. 453-457

Author(s):

D. FINK ◽

J.P. BIERSACK ◽

H. GRAWE ◽

J. RIEDERER ◽

K. MÜLLER ◽

...

Keyword(s):

Fusion Reactor ◽

Nuclear Spectroscopy ◽

Reactor Materials

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SURFACE ROUGHENING OF COPPER BY LOW ENERGY ION BOMBARDMENT

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50065-7 ◽

1980 ◽

pp. 405-409

Author(s):

V. NAUNDORF ◽

M.-P. MACHT

Keyword(s):

Ion Bombardment ◽

Surface Roughening

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DEPTH DISTRIBUTIONS OF LOW ENERGY DEUTERIUM IMPLANTED INTO SILICON AS DETERMINED BY SIMS

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50061-x ◽

1980 ◽

pp. 383-387

Author(s):

CHARLES W. MAGEE ◽

SAMUEL A. COHEN ◽

DONALD E. VOSS ◽

DAVID K. BRICE

Keyword(s):

Depth Distributions

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DEPENDENCE OF DEFECT STRUCTURES ON IMPLANTED IMPURITY SPECIES IN Al SINGLE CRYSTALS

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50053-0 ◽

1980 ◽

pp. 317-321

Author(s):

T. HUSSAIN ◽

G. LINKER

Keyword(s):

Single Crystals ◽

Defect Structures ◽

Impurity Species

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ION-BEAM-INDUCED ANNEALING EFFECTS IN GaAs

Ion Beam Analysis ◽

10.1016/b978-1-4832-2889-1.50051-7 ◽

1980 ◽

pp. 307-312

Author(s):

J.S. WILLIAMS ◽

M.W. AUSTIN

Keyword(s):

Ion Beam ◽

Annealing Effects

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