Ion Beam Analysis
Latest Publications

TOTAL DOCUMENTS

101
(FIVE YEARS 0)

H-INDEX

2
(FIVE YEARS 0)

Published By Elsevier

9781483228891
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

STOPPING POWER AND STRAGGLING OF 80–500 keV LITHIUM IONS IN C, Al, Ni, Cu, Se, Ag, AND Te

1980 ◽  
pp. 75-80 ◽  
Author(s):  
H.H. ANDERSEN ◽  
F. BESENBACHER ◽  
P. GODDIKSEN
Keyword(s):  
Stopping Power ◽  
Lithium Ions

CREATION OF SURFACE DAMAGE ON A NICKEL (110) SURFACE BY BOMBARDMENT WITH 3–30 keV NOBLE GAS IONS

1980 ◽  
pp. 595-599
Author(s):  
L.K. VERHEIJ ◽  
E. VAN LOENEN ◽  
J.A. VAN DEN BERG ◽  
D.G. ARMOUR
Keyword(s):  
Noble Gas ◽  
Surface Damage

ION INDUCED SECONDARY ELECTRON EMISSION AS A PROBE FOR ADSORBED OXYGEN ON TUNGSTEN

1980 ◽  
pp. 579-583
Author(s):  
D. HASSELKAMP ◽  
A. SCHARMANN ◽  
N. STILLER
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Adsorbed Oxygen

HYDROGEN RATIOS AND PROFILES IN DEPOSITED AMORPHOUS AND POLYCRYSTALLINE FILMS AND IN METALS USING NUCLEAR TECHNIQUES

1980 ◽  
pp. 547-550
Author(s):  
R.E. BENENSON ◽  
L.C. FELDMAN ◽  
B.G. BAGLEY
Keyword(s):  
Polycrystalline Films ◽  
Nuclear Techniques

NUCLEAR REACTION ANALYSIS OF HYDROGEN IN AMORPHOUS SILICON AND SILICON CARBIDE FILMS

1980 ◽  
pp. 499-504
Author(s):  
E. LIGEON ◽  
J. FONTENILLE ◽  
R. DANIELOU ◽  
A. GUIVARC'H ◽  
M. LE CONTELLEC ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Amorphous Silicon ◽  
Nuclear Reaction ◽  
Nuclear Reaction Analysis

APPLICATIONS OF (n, p) AND (n, α) REACTIONS AND A BACKSCATTERING TECHNIQUE TO FUSION REACTOR MATERIALS, ARCHEOMETRY, AND NUCLEAR SPECTROSCOPY

1980 ◽  
pp. 453-457
Author(s):  
D. FINK ◽  
J.P. BIERSACK ◽  
H. GRAWE ◽  
J. RIEDERER ◽  
K. MÜLLER ◽  
...  
Keyword(s):  
Fusion Reactor ◽  
Nuclear Spectroscopy ◽  
Reactor Materials

SURFACE ROUGHENING OF COPPER BY LOW ENERGY ION BOMBARDMENT

1980 ◽  
pp. 405-409
Author(s):  
V. NAUNDORF ◽  
M.-P. MACHT
Keyword(s):  
Ion Bombardment ◽  
Low Energy ◽  
Surface Roughening

DEPTH DISTRIBUTIONS OF LOW ENERGY DEUTERIUM IMPLANTED INTO SILICON AS DETERMINED BY SIMS

1980 ◽  
pp. 383-387
Author(s):  
CHARLES W. MAGEE ◽  
SAMUEL A. COHEN ◽  
DONALD E. VOSS ◽  
DAVID K. BRICE
Keyword(s):  
Low Energy ◽  
Depth Distributions

DEPENDENCE OF DEFECT STRUCTURES ON IMPLANTED IMPURITY SPECIES IN Al SINGLE CRYSTALS

1980 ◽  
pp. 317-321
Author(s):  
T. HUSSAIN ◽  
G. LINKER
Keyword(s):  
Single Crystals ◽  
Defect Structures ◽  
Impurity Species
Load More ...
Sign in / Sign up

Export Citation Format

Share Document