scholarly journals Accurate Determination of Grain Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the ζ-Factor Method

2003 ◽  
Vol 9 (S02) ◽  
pp. 668-669
Author(s):  
M. Watanabe ◽  
D.B. Williams
2018 ◽  
Author(s):  
Jorick Maes ◽  
Nicolo Castro ◽  
Kim De Nolf ◽  
Willem Walravens ◽  
Benjamin Abécassis ◽  
...  

<div> <div> <div> <p>The accurate determination of the dimensions of a nano-object is paramount to the de- velopment of nanoscience and technology. Here, we provide procedures for sizing quasi- spherical colloidal nanocrystals (NCs) by means of small-angle x-ray scattering (SAXS). Using PbS NCs as a model system, the protocols outline the extraction of the net NC SAXS pattern by background correction and address the calibration of scattered x-ray intensity to an absolute scale. Different data analysis methods are compared, and we show that they yield nearly identical estimates of the NC diameter in the case of a NC ensemble with a monodisperse and monomodal size distribution. Extending the analysis to PbSe, CdSe </p> </div> </div> <div> <div> <p>and CdS NCs, we provide SAXS calibrated sizing curves, which relate the NC diameter and the NC band-gap energy as determined using absorbance spectroscopy. In compari- son with sizing curves calibrated by means of transmission electron microscopy (TEM), we systematically find that SAXS calibration assigns a larger diameter than TEM calibration to NCs with a given band gap. We attribute this difference to the difficulty of accurately sizing small objects in TEM images. To close, we demonstrate that NC concentrations can be directly extracted from SAXS patterns normalized to an absolute scale, and we show that SAXS-based concentrations agree with concentration estimates based on absorption spectroscopy.</p></div></div></div>


2020 ◽  
Vol 105 (3) ◽  
pp. 353-362
Author(s):  
Katarzyna Luberda-Durnaś ◽  
Marek Szczerba ◽  
Małgorzata Lempart ◽  
Zuzanna Ciesielska ◽  
Arkadiusz Derkowski

Abstract The primary aim of this study was the accurate determination of unit-cell parameters and description of disorder in chlorites with semi-random stacking using common X-ray diffraction (XRD) data for bulk powder samples. In the case of ordered chlorite structures, comprehensive crystallographic information can be obtained based on powder XRD data. Problems arise for samples with semi-random stacking, where due to strong broadening of hkl peaks with k ≠ 3n, the determination of unit-cell parameters is demanding. In this study a complete set of information about the stacking sequences in chlorite structures was determined based on XRD pattern simulation, which included determining a fraction of layers shifted by ±1/3b, interstratification with different polytypes and 2:1 layer rotations. A carefully selected series of pure Mg-Fe tri-trioctahedral chlorites with iron content in the range from 0.1 to 3.9 atoms per half formula unit cell was used in the study. In addition, powder XRD patterns were carefully investigated for the broadening of the odd-number basal reflections to determine interstratification of 14 and 7 Å layers. These type of interstratifications were finally not found in any of the samples. This result was also confirmed by the XRD pattern simulations, assuming interstratification with R0 ordering. Based on h0l XRD reflections, all the studied chlorites were found to be the IIbb polytype with a monoclinic-shaped unit cell (β ≈ 97°). For three samples, the hkl reflections with k ≠ 3n were partially resolvable; therefore, a conventional indexing procedure was applied. Two of the chlorites were found to have a monoclinic cell (with α, γ = 90°). Nevertheless, among all the samples, the more general triclinic (pseudomonoclinic) crystal system with symmetry C1 was assumed, to calculate unit-cell parameters using Le Bail fitting. A detailed study of semi-random stacking sequences shows that simple consideration of the proportion of IIb-2 and IIb-4/6 polytypes, assuming equal content of IIb-4 and IIb-6, is not sufficient to fully model the stacking structure in chlorites. Several, more general, possible models were therefore considered. In the first approach, a parameter describing a shift into one of the ±1/3b directions (thus, the proportion of IIb-4 and IIb-6 polytypes) was refined. In the second approach, for samples with slightly distinguishable hkl reflections with k ≠ 3n, some kind of segregation of individual polytypes (IIb-2/4/6) was considered. In the third approach, a model with rotations of 2:1 layers about 0°, 120°, 240° was shown to have the lowest number of parameters to be optimized and therefore give the most reliable fits. In all of the studied samples, interstratification of different polytypes was revealed with the fraction of polytypes being different than IIbb ranging from 5 to 19%, as confirmed by fitting of h0l XRD reflections.


2009 ◽  
Vol 694 (2) ◽  
pp. 1115-1120 ◽  
Author(s):  
Zhongxiang Wang ◽  
Cees Bassa ◽  
Andrew Cumming ◽  
Victoria M. Kaspi

1968 ◽  
Vol 12 ◽  
pp. 546-562
Author(s):  
R. Tertian

AbstractThe double dilution method has many important advantages. For any element to be determined, let us say A, It enables us to control or calculate the matrix factor (sum of the absorption end enhancement effects) for the sample being Investigated towards A radiation, and it furnishes corrected Intensities which are strictly proportional to A concentration. Thus the results are exact, whatever the general composition of the sample, their accuracy depending only on the quality of measurement and preparation. Another major practical advantage is that the method does not require systematic calibration but only a few permanent standards consisting of a pure compound or of an accurately known sample.The procedure has been tested successfully for accurate determination of rare earth elements using, for solid materials such as ores and oxide mixtures, the borax fusion technique. It also can be readily applied to liquids. All the rare earth elements can be titrated by that method, as well as yttrium, thorium and, if necessary, all the elements relevant to X-ray fluorescence analysis. The concentration range considered for solids is of one comprised between 0.5 and 100 % and, with a lesser accuracy, between 0.1 and 0-5 % Examples are given relative to the analysis of various ores. Finally it rcust be pointed out that the method is universal and applies to the analysis of every solid, especially ores, provided that they can be converted to solid or liquid solutions. It appears that most industrial analyses can be worked on In this way.


1983 ◽  
Vol 27 ◽  
pp. 397-404
Author(s):  
J. S. Pressnall ◽  
J. J. Fitzpatrick ◽  
Paul Predecki

AbstractA computer-controlled high temperature Guinier diffractometer system for accurate determination of lattice thermal expansion is described. A critical test of the system using α-Al2O3 (0.3μ polishing alumina) showed close agreement with the single crystal expansion data of Wachtman et al. Lattice thermal expansion of cordierite doped with the following dopants: Ge+4, P+5, Zn+2, Li+1 and Ca+2 was investigated. Of these the Li+1 at the 5% level (5% of Si+4 replaced by Li+1 + Al+3) produced the largest decrease in mean lattice expansion.


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